Yili Hong

Xinyi Song, Kennedy Odongo, Francis G. Pascual et al.

Photovoltaics (PV) are widely used to harvest solar energy, an important form of renewable energy. Photovoltaic arrays consist of multiple solar panels constructed from solar cells. Solar cells in the field are vulnerable to various defects, and electroluminescence (EL) imaging provides effective and non-destructive diagnostics to detect those defects. We use multiple traditional machine learning and modern deep learning models to classify EL solar cell images into different functional/defective categories. Because of the asymmetry in the number of functional vs. defective cells, an imbalanced label problem arises in the EL image data. The current literature lacks insights on which methods and metrics to use for model training and prediction. In this paper, we comprehensively compare different machine learning and deep learning methods under different performance metrics on the classification of solar cell EL images from monocrystalline and polycrystalline modules. We provide a comprehensive discussion on different metrics. Our results provide insights and guidelines for practitioners in selecting prediction methods and performance metrics.

Yili Hong, Jiayi Lian, Li Xu et al.

Artificial intelligence (AI) systems have become increasingly popular in many areas. Nevertheless, AI technologies are still in their developing stages, and many issues need to be addressed. Among those, the reliability of AI systems needs to be demonstrated so that the AI systems can be used with confidence by the general public. In this paper, we provide statistical perspectives on the reliability of AI systems. Different from other considerations, the reliability of AI systems focuses on the time dimension. That is, the system can perform its designed functionality for the intended period. We introduce a so-called SMART statistical framework for AI reliability research, which includes five components: Structure of the system, Metrics of reliability, Analysis of failure causes, Reliability assessment, and Test planning. We review traditional methods in reliability data analysis and software reliability, and discuss how those existing methods can be transformed for reliability modeling and assessment of AI systems. We also describe recent developments in modeling and analysis of AI reliability and outline statistical research challenges in this area, including out-of-distribution detection, the effect of the training set, adversarial attacks, model accuracy, and uncertainty quantification, and discuss how those topics can be related to AI reliability, with illustrative examples. Finally, we discuss data collection and test planning for AI reliability assessment and how to improve system designs for higher AI reliability. The paper closes with some concluding remarks.

Yili Hong, Jie Min, Caleb B. King et al.

Artificial intelligence (AI) systems have become increasingly common and the trend will continue. Examples of AI systems include autonomous vehicles (AV), computer vision, natural language processing, and AI medical experts. To allow for safe and effective deployment of AI systems, the reliability of such systems needs to be assessed. Traditionally, reliability assessment is based on reliability test data and the subsequent statistical modeling and analysis. The availability of reliability data for AI systems, however, is limited because such data are typically sensitive and proprietary. The California Department of Motor Vehicles (DMV) oversees and regulates an AV testing program, in which many AV manufacturers are conducting AV road tests. Manufacturers participating in the program are required to report recurrent disengagement events to California DMV. This information is being made available to the public. In this paper, we use recurrent disengagement events as a representation of the reliability of the AI system in AV, and propose a statistical framework for modeling and analyzing the recurrent events data from AV driving tests. We use traditional parametric models in software reliability and propose a new nonparametric model based on monotonic splines to describe the event process. We develop inference procedures for selecting the best models, quantifying uncertainty, and testing heterogeneity in the event process. We then analyze the recurrent events data from four AV manufacturers, and make inferences on the reliability of the AI systems in AV. We also describe how the proposed analysis can be applied to assess the reliability of other AI systems.