Yiran Wang

Suchuan Dong, Yiran Wang

We present a method for computing the inverse parameters and the solution field to inverse parametric PDEs based on randomized neural networks. This extends the local extreme learning machine technique originally developed for forward PDEs to inverse problems. We develop three algorithms for training the neural network to solve the inverse PDE problem. The first algorithm (NLLSQ) determines the inverse parameters and the trainable network parameters all together by the nonlinear least squares method with perturbations (NLLSQ-perturb). The second algorithm (VarPro-F1) eliminates the inverse parameters from the overall problem by variable projection to attain a reduced problem about the trainable network parameters only. It solves the reduced problem first by the NLLSQ-perturb algorithm for the trainable network parameters, and then computes the inverse parameters by the linear least squares method. The third algorithm (VarPro-F2) eliminates the trainable network parameters from the overall problem by variable projection to attain a reduced problem about the inverse parameters only. It solves the reduced problem for the inverse parameters first, and then computes the trainable network parameters afterwards. VarPro-F1 and VarPro-F2 are reciprocal to each other in a sense. The presented method produces accurate results for inverse PDE problems, as shown by the numerical examples herein. For noise-free data, the errors for the inverse parameters and the solution field decrease exponentially as the number of collocation points or the number of trainable network parameters increases, and can reach a level close to the machine accuracy. For noisy data, the accuracy degrades compared with the case of noise-free data, but the method remains quite accurate. The presented method has been compared with the physics-informed neural network method.

Yiran Wang, Li Xiao

It has been shown that traditional deep learning methods for electronic microscopy segmentation usually suffer from low transferability when samples and annotations are limited, while large-scale vision foundation models are more robust when transferring between different domains but facing sub-optimal improvement under fine-tuning. In this work, we present a new few-shot domain adaptation framework SAMDA, which combines the Segment Anything Model(SAM) with nnUNet in the embedding space to achieve high transferability and accuracy. Specifically, we choose the Unet-based network as the "expert" component to learn segmentation features efficiently and design a SAM-based adaptation module as the "generic" component for domain transfer. By amalgamating the "generic" and "expert" components, we mitigate the modality imbalance in the complex pre-training knowledge inherent to large-scale Vision Foundation models and the challenge of transferability inherent to traditional neural networks. The effectiveness of our model is evaluated on two electron microscopic image datasets with different modalities for mitochondria segmentation, which improves the dice coefficient on the target domain by 6.7%. Also, the SAM-based adaptor performs significantly better with only a single annotated image than the 10-shot domain adaptation on nnUNet. We further verify our model on four MRI datasets from different sources to prove its generalization ability.