M. A. Eriksson

Daniel Schug, Tyler J. Kovach, M. A. Wolfe et al.

The rapid development of quantum dot (QD) devices for quantum computing has necessitated more efficient and automated methods for device characterization and tuning. This work demonstrates the feasibility and advantages of applying explainable machine learning techniques to the analysis of quantum dot measurements, paving the way for further advances in automated and transparent QD device tuning. Many of the measurements acquired during the tuning process come in the form of images that need to be properly analyzed to guide the subsequent tuning steps. By design, features present in such images capture certain behaviors or states of the measured QD devices. When considered carefully, such features can aid the control and calibration of QD devices. An important example of such images are so-called $\textit{triangle plots}$, which visually represent current flow and reveal characteristics important for QD device calibration. While image-based classification tools, such as convolutional neural networks (CNNs), can be used to verify whether a given measurement is $\textit{good}$ and thus warrants the initiation of the next phase of tuning, they do not provide any insights into how the device should be adjusted in the case of $\textit{bad}$ images. This is because CNNs sacrifice prediction and model intelligibility for high accuracy. To ameliorate this trade-off, a recent study introduced an image vectorization approach that relies on the Gabor wavelet transform (Schug $\textit{et al.}$ 2024 $\textit{Proc. XAI4Sci: Explainable Machine Learning for Sciences Workshop (AAAI 2024) (Vancouver, Canada)}$ pp 1-6). Here we propose an alternative vectorization method that involves mathematical modeling of synthetic triangles to mimic the experimental data. Using explainable boosting machines, we show that this new method offers superior explainability of model prediction without sacrificing accuracy.

Tyler J. Kovach, Daniel Schug, M. A. Wolfe et al.

Semiconductor quantum dot (QD) devices have become central to advancements in spin-based quantum computing. However, the increasing complexity of modern QD devices makes calibration and control -- particularly at elevated temperatures -- a bottleneck to progress, highlighting the need for robust and scalable autonomous solutions. A major hurdle arises from trapped charges within the oxide layers, which induce random offset voltage shifts on gate electrodes, with a standard deviation of approximately 83~\si{\milli\volt} of variation within state-of-the-art present-day devices. Efficient characterization and tuning of large arrays of QD qubits depend on choices of automated protocols. Here, we introduce a physically intuitive framework for a bootstrapping, autonomous testing, and initialization system (BATIS) designed to streamline QD device evaluation and calibration. BATIS navigates high-dimensional gate voltage spaces, automating essential steps such as leakage testing, formation of all current channels, and gate characterization in the presence of trapped charges. For forming the current channels, BATIS follows a non-standard approach that requires a single set of measurements regardless of the number of channels. Demonstrated at $1.3$~\si{\kelvin} on a quad-QD Si/Si$_x$Ge$_{1-x}$ device, BATIS eliminates the need for deep cryogenic environments during initial device diagnostics, significantly enhancing scalability and reducing setup times. By requiring only minimal prior knowledge of the device architecture, BATIS represents a platform-agnostic solution, adaptable to various QD systems, which bridges a critical gap in QD autotuning.

Joshua Ziegler, Thomas McJunkin, E. S. Joseph et al.

The current autotuning approaches for quantum dot (QD) devices, while showing some success, lack an assessment of data reliability. This leads to unexpected failures when noisy or otherwise low-quality data is processed by an autonomous system. In this work, we propose a framework for robust autotuning of QD devices that combines a machine learning (ML) state classifier with a data quality control module. The data quality control module acts as a "gatekeeper" system, ensuring that only reliable data are processed by the state classifier. Lower data quality results in either device recalibration or termination. To train both ML systems, we enhance the QD simulation by incorporating synthetic noise typical of QD experiments. We confirm that the inclusion of synthetic noise in the training of the state classifier significantly improves the performance, resulting in an accuracy of 95.0(9) % when tested on experimental data. We then validate the functionality of the data quality control module by showing that the state classifier performance deteriorates with decreasing data quality, as expected. Our results establish a robust and flexible ML framework for autonomous tuning of noisy QD devices.