STEAM: Self-Supervised Taxonomy Expansion with Mini-PathsYue Yu, Yinghao Li, Jiaming Shen et al.
Taxonomies are important knowledge ontologies that underpin numerous applications on a daily basis, but many taxonomies used in practice suffer from the low coverage issue. We study the taxonomy expansion problem, which aims to expand existing taxonomies with new concept terms. We propose a self-supervised taxonomy expansion model named STEAM, which leverages natural supervision in the existing taxonomy for expansion. To generate natural self-supervision signals, STEAM samples mini-paths from the existing taxonomy, and formulates a node attachment prediction task between anchor mini-paths and query terms. To solve the node attachment task, it learns feature representations for query-anchor pairs from multiple views and performs multi-view co-training for prediction. Extensive experiments show that STEAM outperforms state-of-the-art methods for taxonomy expansion by 11.6\% in accuracy and 7.0\% in mean reciprocal rank on three public benchmarks. The implementation of STEAM can be found at \url{https://github.com/yueyu1030/STEAM}.
4.4LGNov 12, 2021
Soft Sensing Model Visualization: Fine-tuning Neural Network from What Model LearnedXiaoye Qian, Chao Zhang, Jaswanth Yella et al.
The growing availability of the data collected from smart manufacturing is changing the paradigms of production monitoring and control. The increasing complexity and content of the wafer manufacturing process in addition to the time-varying unexpected disturbances and uncertainties, make it infeasible to do the control process with model-based approaches. As a result, data-driven soft-sensing modeling has become more prevalent in wafer process diagnostics. Recently, deep learning has been utilized in soft sensing system with promising performance on highly nonlinear and dynamic time-series data. Despite its successes in soft-sensing systems, however, the underlying logic of the deep learning framework is hard to understand. In this paper, we propose a deep learning-based model for defective wafer detection using a highly imbalanced dataset. To understand how the proposed model works, the deep visualization approach is applied. Additionally, the model is then fine-tuned guided by the deep visualization. Extensive experiments are performed to validate the effectiveness of the proposed system. The results provide an interpretation of how the model works and an instructive fine-tuning method based on the interpretation.
8.0ASJun 21, 2019
Multi-Span Acoustic Modelling using Raw Waveform SignalsPatrick von Platen, Chao Zhang, Philip Woodland
Traditional automatic speech recognition (ASR) systems often use an acoustic model (AM) built on handcrafted acoustic features, such as log Mel-filter bank (FBANK) values. Recent studies found that AMs with convolutional neural networks (CNNs) can directly use the raw waveform signal as input. Given sufficient training data, these AMs can yield a competitive word error rate (WER) to those built on FBANK features. This paper proposes a novel multi-span structure for acoustic modelling based on the raw waveform with multiple streams of CNN input layers, each processing a different span of the raw waveform signal. Evaluation on both the single channel CHiME4 and AMI data sets show that multi-span AMs give a lower WER than FBANK AMs by an average of about 5% (relative). Analysis of the trained multi-span model reveals that the CNNs can learn filters that are rather different to the log Mel filters. Furthermore, the paper shows that a widely used single span raw waveform AM can be improved by using a smaller CNN kernel size and increased stride to yield improved WERs.