Xiaolu Liu

Song Wang, Xiaolu Liu, Lingdong Kong et al.

Self-supervised representation learning for point cloud has demonstrated effectiveness in improving pre-trained model performance across diverse tasks. However, as pre-trained models grow in complexity, fully fine-tuning them for downstream applications demands substantial computational and storage resources. Parameter-efficient fine-tuning (PEFT) methods offer a promising solution to mitigate these resource requirements, yet most current approaches rely on complex adapter and prompt mechanisms that increase tunable parameters. In this paper, we propose PointLoRA, a simple yet effective method that combines low-rank adaptation (LoRA) with multi-scale token selection to efficiently fine-tune point cloud models. Our approach embeds LoRA layers within the most parameter-intensive components of point cloud transformers, reducing the need for tunable parameters while enhancing global feature capture. Additionally, multi-scale token selection extracts critical local information to serve as prompts for downstream fine-tuning, effectively complementing the global context captured by LoRA. The experimental results across various pre-trained models and three challenging public datasets demonstrate that our approach achieves competitive performance with only 3.43% of the trainable parameters, making it highly effective for resource-constrained applications. Source code is available at: https://github.com/songw-zju/PointLoRA.

Shuai Li, Shihan Chen, Wanru Geng et al.

In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods, reliant on manual inspection or early image processing algorithms, suffer from inefficiencies, high costs, and limited robustness. This paper introduces a semi-supervised defect detection framework based on conditional diffusion (DSYM), leveraging a two-stage collaborative training mechanism and a staged joint optimization strategy. The framework utilizes labeled data for initial training and subsequently incorporates unlabeled data through the generation of pseudo-labels. A conditional diffusion model synthesizes multi-scale pseudo-defect samples, while a CLIP cross-modal feature-based noise filtering mechanism mitigates label contamination. Experimental results on the NEU-DET dataset demonstrate a 78.4% mAP@0.5 with the same amount of labeled data as traditional supervised methods, and 75.1% mAP@0.5 with only 40% of the labeled data required by the original supervised model, showcasing significant advantages in data efficiency. This research provides a high-precision, low-labeling-dependent solution for defect detection in industrial quality inspection scenarios. The work of this article has been open-sourced at https://github.com/cLin-c/Semisupervised-DSYM.