Yue Lu

Yuejun Jiao, Song Qiu, Mingsong Chen et al.

In recent years, vehicle re-identification (Re-ID) has gained increasing importance in various applications such as assisted driving systems, traffic flow management, and vehicle tracking, due to the growth of intelligent transportation systems. However, the presence of extraneous background information and occlusions can interfere with the learning of discriminative features, leading to significant variations in the same vehicle image across different scenarios. This paper proposes a method, named graph network based on dynamic similarity adjacency matrices (DSAM-GN), which incorporates a novel approach for constructing adjacency matrices to capture spatial relationships of local features and reduce background noise. Specifically, the proposed method divides the extracted vehicle features into different patches as nodes within the graph network. A spatial attention-based similarity adjacency matrix generation (SASAMG) module is employed to compute similarity matrices of nodes, and a dynamic erasure operation is applied to disconnect nodes with low similarity, resulting in similarity adjacency matrices. Finally, the nodes and similarity adjacency matrices are fed into graph networks to extract more discriminative features for vehicle Re-ID. Experimental results on public datasets VeRi-776 and VehicleID demonstrate the effectiveness of the proposed method compared with recent works.

Botong. Zhao, Xubin. Wang, Shujing. Lyu et al.

Integrated circuit manufacturing is highly complex, comprising hundreds of process steps. Defects can arise at any stage, causing yield loss and ultimately degrading product reliability. Supervised methods require extensive human annotation and struggle with emergent categories and rare, data scarce defects. Clustering-based unsupervised methods often exhibit unstable performance due to missing priors. We propose IC DefectNCD, a support set free framework that leverages Image Intrinsic Priors in IC SEM images for defect detection and novel class discovery. We first develop Self Normal Information Guided IC Defect Detection, aggregating representative normal features via a learnable normal information extractor and using reconstruction residuals to coarsely localize defect regions. To handle saliency variations across defects, we introduce an adaptive binarization strategy that produces stable subimages focused on core defective areas. Finally, we design Self Defect Information Guided IC Defect Classification, which incorporates a soft mask guided attention mechanism to inject spatial defect priors into the teacher student model. This enhances sensitivity to defective regions, suppresses background interference, and enables recognition and classification of unseen defects. We validate the approach on a real world dataset spanning three key fabrication stages and covering 15 defect types. Experiments demonstrate robust performance on both defect detection and unseen defect classification.

Jiajun Wei, Hongjian Zhan, Xiao Tu et al.

Employing a dictionary can efficiently rectify the deviation between the visual prediction and the ground truth in scene text recognition methods. However, the independence of the dictionary on the visual features may lead to incorrect rectification of accurate visual predictions. In this paper, we propose a new dictionary language model leveraging the Scene Image-Text Matching(SITM) network, which avoids the drawbacks of the explicit dictionary language model: 1) the independence of the visual features; 2) noisy choice in candidates etc. The SITM network accomplishes this by using Image-Text Contrastive (ITC) Learning to match an image with its corresponding text among candidates in the inference stage. ITC is widely used in vision-language learning to pull the positive image-text pair closer in feature space. Inspired by ITC, the SITM network combines the visual features and the text features of all candidates to identify the candidate with the minimum distance in the feature space. Our lexicon method achieves better results(93.8\% accuracy) than the ordinary method results(92.1\% accuracy) on six mainstream benchmarks. Additionally, we integrate our method with ABINet and establish new state-of-the-art results on several benchmarks.