Farah Ferdaus

h-index19
2papers

2 Papers

LGOct 31, 2024
LLM-Inference-Bench: Inference Benchmarking of Large Language Models on AI Accelerators

Krishna Teja Chitty-Venkata, Siddhisanket Raskar, Bharat Kale et al.

Large Language Models (LLMs) have propelled groundbreaking advancements across several domains and are commonly used for text generation applications. However, the computational demands of these complex models pose significant challenges, requiring efficient hardware acceleration. Benchmarking the performance of LLMs across diverse hardware platforms is crucial to understanding their scalability and throughput characteristics. We introduce LLM-Inference-Bench, a comprehensive benchmarking suite to evaluate the hardware inference performance of LLMs. We thoroughly analyze diverse hardware platforms, including GPUs from Nvidia and AMD and specialized AI accelerators, Intel Habana and SambaNova. Our evaluation includes several LLM inference frameworks and models from LLaMA, Mistral, and Qwen families with 7B and 70B parameters. Our benchmarking results reveal the strengths and limitations of various models, hardware platforms, and inference frameworks. We provide an interactive dashboard to help identify configurations for optimal performance for a given hardware platform.

CRJul 19, 2021
A Non-invasive Technique to Detect Authentic/Counterfeit SRAM Chips

B. M. S. Bahar Talukder, Farah Ferdaus, Md Tauhidur Rahman

Many commercially available memory chips are fabricated worldwide in untrusted facilities. Therefore, a counterfeit memory chip can easily enter into the supply chain in different formats. Deploying these counterfeit memory chips into an electronic system can severely affect security and reliability domains because of their sub-standard quality, poor performance, and shorter lifespan. Therefore, a proper solution is required to identify counterfeit memory chips before deploying them in mission-, safety-, and security-critical systems. However, a single solution to prevent counterfeiting is challenging due to the diversity of counterfeit types, sources, and refinement techniques. Besides, the chips can pass initial testing and still fail while being used in the system. Furthermore, existing solutions focus on detecting a single counterfeit type (e.g., detecting recycled memory chips). This work proposes a framework that detects major counterfeit static random-access memory (SRAM) types by attesting/identifying the origin of the manufacturer. The proposed technique generates a single signature for a manufacturer and does not require any exhaustive registration/authentication process. We validate our proposed technique using 345 SRAM chips produced by major manufacturers. The silicon results show that the test scores ($F_{1}$ score) of our proposed technique of identifying memory manufacturer and part-number are 93% and 71%, respectively.