Ran Mo

Zengyang Li, Sicheng Wang, Wenshuo Wang et al.

Deep learning frameworks (DLFs) have been playing an increasingly important role in this intelligence age since they act as a basic infrastructure for an increasingly wide range of AIbased applications. Meanwhile, as multi-programming-language (MPL) software systems, DLFs are inevitably suffering from bugs caused by the use of multiple programming languages (PLs). Hence, it is of paramount significance to understand the bugs (especially the bugs involving multiple PLs, i.e., MPL bugs) of DLFs, which can provide a foundation for preventing, detecting, and resolving bugs in the development of DLFs. To this end, we manually analyzed 1497 bugs in three MPL DLFs, namely MXNet, PyTorch, and TensorFlow. First, we classified bugs in these DLFs into 12 types (e.g., algorithm design bugs and memory bugs) according to their bug labels and characteristics. Second, we further explored the impacts of different bug types on the development of DLFs, and found that deployment bugs and memory bugs negatively impact the development of DLFs in different aspects the most. Third, we found that 28.6%, 31.4%, and 16.0% of bugs in MXNet, PyTorch, and TensorFlow are MPL bugs, respectively; the PL combination of Python and C/C++ is most used in fixing more than 92% MPL bugs in all DLFs. Finally, the code change complexity of MPL bug fixes is significantly greater than that of single-programming-language (SPL) bug fixes in all the three DLFs, while in PyTorch MPL bug fixes have longer open time and greater communication complexity than SPL bug fixes. These results provide insights for bug management in DLFs.

Zengyang Li, Binbin Huang, Yimeng Li et al.

Industrial Internet of Things (IIoT) has become a prominent topic recently, with an increasing number of IIoT OSS projects emerging, also within the Eclipse Foundation. Code cloning is a common practice that can adversely affect software maintenance. In the IIoT OSS domain, developers frequently reuse code and configurations for efficiency, which can lead to code clone proliferation and maintenance challenges. However, the extent and effects of code clones in the IIoT OSS domain remain understudied. This study aims to investigate the prevalence, evolution, and co-modification of code clones within the Eclipse IIoT OSS ecosystem. We collected 90 release versions from 15 projects in the Eclipse IIoT OSS ecosystem, and investigated their code clone situations based on source code and change history using the NiCad tool and our custom analysis module. The investigation covered clone distribution, patterns, evolution trends, co-modified clones, and cross-project clones. 1) Code clones are prevalent in Eclipse IIoT OSS projects, with 16.3% of code lines involved in clones - nearly twice the proportion observed in traditional OSS projects; 2) Most code clones occur between commits, while there are still a significant proportion of code clones that each clone pair happens within a commit; 3) Most Eclipse IIoT projects remain stable in clone numbers during version iterations; 4) An average of 0.17% of the clones have been co-modified, which negatively affect maintenance; and 5) Cross-project clone pairs are prevalent, more in Java than in C projects, with rare co-modifications (0.02%) only in Java projects. Our findings highlight the potential negative impacts of these clones on software maintenance, emphasizing the need to address these issues to improve overall software quality.