Yibo Jiao

Hang-Cheng Dong, Yuhao Jiang, Yibo Jiao et al.

The deployment of AI systems in safety-critical domains, such as industrial defect inspection, autonomous driving, and medical diagnosis, is severely hampered by their lack of reliability. A single undetected erroneous prediction can lead to catastrophic outcomes. Unfortunately, there is often no alternative but to place trust in the outputs of a trained AI system, which operates without an internal safeguard to flag unreliable predictions, even in cases of high accuracy. We propose a post-hoc explanation-based indicator to detect false negatives in binary defect detection networks. To our knowledge, this is the first method to proactively identify potentially erroneous network outputs. Our core idea leverages the difference between class-specific discriminative heatmaps and class-agnostic ones. We compute the difference in their intersection over union (IoU) as a reliability score. An adversarial enhancement method is further introduced to amplify this disparity. Evaluations on two industrial defect detection benchmarks show our method effectively identifies false negatives. With adversarial enhancement, it achieves 100\% recall, albeit with a trade-off for true negatives. Our work thus advocates for a new and trustworthy deployment paradigm: data-model-explanation-output, moving beyond conventional end-to-end systems to provide critical support for reliable AI in real-world applications.

Hang-Cheng Dong, Yibo Jiao, Fupeng Wei et al.

Industrial surface defect inspection for sample-wise quality control (QC) must simultaneously decide whether a given sample contains defects and localize those defects spatially. In real production lines, extreme foreground-background imbalance, defect sparsity with a long-tailed scale distribution, and low contrast are common. As a result, pixel-centric training and evaluation are easily dominated by large homogeneous regions, making it difficult to drive models to attend to small or low-contrast defects-one of the main bottlenecks for deployment. Empirically, existing models achieve strong pixel-overlap metrics (e.g., mIoU) but exhibit insufficient stability at the sample level, especially for sparse or slender defects. The root cause is a mismatch between the optimization objective and the granularity of QC decisions. To address this, we propose a sample-centric multi-task learning framework and evaluation suite. Built on a shared-encoder architecture, the method jointly learns sample-level defect classification and pixel-level mask localization. Sample-level supervision modulates the feature distribution and, at the gradient level, continually boosts recall for small and low-contrast defects, while the segmentation branch preserves boundary and shape details to enhance per-sample decision stability and reduce misses. For evaluation, we propose decision-linked metrics, Seg_mIoU and Seg_Recall, which remove the bias of classical mIoU caused by empty or true-negative samples and tightly couple localization quality with sample-level decisions. Experiments on two benchmark datasets demonstrate that our approach substantially improves the reliability of sample-level decisions and the completeness of defect localization.