He Wang

Jiawei Lu, Yingpeng Zhang, Zengjun Zhao et al.

Large-scale text-guided image diffusion models have shown astonishing results in text-to-image (T2I) generation. However, applying these models to synthesize textures for 3D geometries remains challenging due to the domain gap between 2D images and textures on a 3D surface. Early works that used a projecting-and-inpainting approach managed to preserve generation diversity but often resulted in noticeable artifacts and style inconsistencies. While recent methods have attempted to address these inconsistencies, they often introduce other issues, such as blurring, over-saturation, or over-smoothing. To overcome these challenges, we propose a novel text-to-texture synthesis framework that leverages pretrained diffusion models. We first introduce a local attention reweighing mechanism in the self-attention layers to guide the model in concentrating on spatial-correlated patches across different views, thereby enhancing local details while preserving cross-view consistency. Additionally, we propose a novel latent space merge pipeline, which further ensures consistency across different viewpoints without sacrificing too much diversity. Our method significantly outperforms existing state-of-the-art techniques regarding texture consistency and visual quality, while delivering results much faster than distillation-based methods. Importantly, our framework does not require additional training or fine-tuning, making it highly adaptable to a wide range of models available on public platforms.

Jihao Gu, Kun Li, He Wang et al.

Video Anomaly Detection (VAD) aims to identify anomalous events within video segments. In scenarios such as surveillance or industrial process monitoring, anomaly detection is of critical importance. While existing approaches are semi-automated, requiring human assessment for anomaly detection, traditional VADs offer limited output as either normal or anomalous. We propose Text-guided Fine-Grained Video Anomaly Detection (T-VAD), a framework built upon Large Vision-Language Model (LVLM). T-VAD introduces an Anomaly Heatmap Decoder (AHD) that performs pixel-wise visual-textual feature alignment to generate fine-grained anomaly heatmaps. Furthermore, we design a Region-aware Anomaly Encoder (RAE) that transforms the heatmaps into learnable textual embeddings, guiding the LVLM to accurately identify and localize anomalous events in videos. This significantly enhances both the granularity and interactivity of anomaly detection. The proposed method achieving SOTA performance by demonstrating 94.8% Area Under the Curve (AUC, specifically micro-AUC) and 67.8%/76.7% accuracy in anomaly heatmaps (RBDC/TBDC) on the UBnormal dataset, and subjectively verified more preferable textual description on the ShanghaiTech-based dataset (BLEU-4: 62.67 for targets, 88.84 for trajectories; Yes/No accuracy: 97.67%), and on the UBnormal dataset (BLEU-4: 50.32 for targets, 78.10 for trajectories; Yes/No accuracy: 89.73%).

Xiaolin Yan, Yangxing Liu, Jiazhang Zheng et al.

Large language models (LLMs) have recently achieved significant advances in reasoning and demonstrated their advantages in solving challenging problems. Yet, their effectiveness in the semiconductor display industry remains limited due to a lack of domain-specific training and expertise. To bridge this gap, we present X-Intelligence 3.0, the first high-performance reasoning model specifically developed for the semiconductor display industry. This model is designed to deliver expert-level understanding and reasoning for the industry's complex challenges. Leveraging a carefully curated industry knowledge base, the model undergoes supervised fine-tuning and reinforcement learning to enhance its reasoning and comprehension capabilities. To further accelerate development, we implemented an automated evaluation framework that simulates expert-level assessments. We also integrated a domain-specific retrieval-augmented generation (RAG) mechanism, resulting in notable performance gains on benchmark datasets. Despite its relatively compact size of 32 billion parameters, X-Intelligence 3.0 outperforms SOTA DeepSeek-R1-671B across multiple evaluations. This demonstrates its exceptional efficiency and establishes it as a powerful solution to the longstanding reasoning challenges faced by the semiconductor display industry.