Bin Sun, Rengang Zhang, Zhiteng Chao et al.
Automatic test pattern generation (ATPG) is a crucial process in integrated circuit (IC) design and testing, responsible for efficiently generating test patterns. As semiconductor technology progresses, traditional ATPG struggles with long execution times to achieve the expected fault coverage, which impacts the time-to-market of chips. Recent machine learning techniques, like reinforcement learning (RL) and graph neural networks (GNNs), show promise but face issues such as reward delay in RL models and inadequate circuit representation in GNN-based methods. In this paper, we propose InF-ATPG, an intelligent FFR-driven ATPG framework that overcomes these challenges by using advanced circuit representation to guide RL. By partitioning circuits into fanout-free regions (FFRs) and incorporating ATPG-specific features into a novel QGNN architecture, InF-ATPG enhances test pattern generation efficiency. Experimental results show InF-ATPG reduces backtracks by 55.06\% on average compared to traditional methods and 38.31\% compared to the machine learning approach, while also improving fault coverage.