Z. Y. Hu

Zhengpei Hu, Kai Li, Dapeng Fu et al.

The exponential expansion of context windows in LLMs has unlocked capabilities for long-document understanding but introduced severe bottlenecks in inference latency and information utilization. Existing compression methods often suffer from high training costs or semantic fragmentation due to aggressive token pruning. In this paper, we propose BEAVER, a novel training-free framework that shifts compression from linear token removal to structure-aware hierarchical selection. BEAVER maximizes hardware parallelism by mapping variable-length contexts into dense page-level tensors via dual-path pooling, and preserves discourse integrity through a hybrid planner combining semantic and lexical dual-branch selection with sentence smoothing. Extensive evaluations on four long-context benchmarks demonstrate that BEAVER achieves comparable performance to state-of-the-art (SOTA) methods like LongLLMLingua. Notably, on the RULER benchmark, BEAVER maintains high fidelity in multi-needle retrieval where baselines deteriorate. Regarding efficiency, BEAVER reduces latency by 26.4x on 128k contexts, offering a scalable solution for high-throughput applications. Our code is available at https://cslikai.cn/BEAVER/.

Yuanhao Tang, Xuechao Zou, Zhengpei Hu et al.

Remote sensing image scene classification remains a challenging task, primarily due to the complex spatial structures and multi-scale characteristics of ground objects. Existing approaches see CNNs excel at modeling local textures, while Transformers excel at capturing global context. However, efficiently integrating them remains a bottleneck due to the high computational cost of Transformers. To tackle this, we propose AFM-Net, a novel Advanced Hierarchical Fusing framework that achieves effective local and global co-representation through two pathways: a CNN branch for extracting hierarchical visual priors, and a Mamba branch for efficient global sequence modeling. The core innovation of AFM-Net lies in its Hierarchical Fusion Mechanism, which progressively aggregates multi-scale features from both pathways, enabling dynamic cross-level feature interaction and contextual reconstruction to produce highly discriminative representations. These fused features are then adaptively routed through a Mixture-of-Experts classifier module, which dispatches them to the most suitable experts for fine-grained scene recognition. Experiments on AID, NWPU-RESISC45, and UC Merced show that AFM-Net obtains 93.72, 95.54, and 96.92 percent accuracy, surpassing state-of-the-art methods with balanced performance and efficiency. Code is available at https://github.com/tangyuanhao-qhu/AFM-Net.

Zhining Hu, Tobias Schlosser, Michael Friedrich et al.

In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural networks are the current state of the art in (semi-)automated visual inspection. However, they are notoriously known to require a particularly large amount of data for model training. To address these challenges, we explore the application of generative adversarial networks (GAN) for image data augmentation and classification of semiconductor wafer dicing induced defects to enhance the variety and balance of training data for visual inspection systems. With this approach, synthetic yet realistic images are generated that mimic real-world dicing defects. We employ three different GAN variants for high-resolution image synthesis: Deep Convolutional GAN (DCGAN), CycleGAN, and StyleGAN3. Our work-in-progress results demonstrate that improved classification accuracies can be obtained, showing an average improvement of up to 23.1 % from 65.1 % (baseline experiment) to 88.2 % (DCGAN experiment) in balanced accuracy, which may enable yield optimization in production.