Chungpa Lee

Chungpa Lee, Joonhwan Chang, Jy-yong Sohn

Contrastive learning has emerged as a prominent branch of self-supervised learning for several years. Especially, CLIP, which applies contrastive learning to large sets of captioned images, has garnered significant attention. Recently, SigLIP, a variant of CLIP, has been proposed, which uses the sigmoid loss instead of the standard InfoNCE loss. SigLIP achieves the performance comparable to CLIP in a more efficient manner by eliminating the need for a global view. However, theoretical understanding of using the sigmoid loss in contrastive learning is underexplored. In this paper, we provide a theoretical analysis of using the sigmoid loss in contrastive learning, in the perspective of the geometric structure of learned embeddings. First, we propose the double-Constant Embedding Model (CCEM), a framework for parameterizing various well-known embedding structures by a single variable. Interestingly, the proposed CCEM is proven to contain the optimal embedding with respect to the sigmoid loss. Second, we mathematically analyze the optimal embedding minimizing the sigmoid loss for contrastive learning. The optimal embedding ranges from simplex equiangular-tight-frame to antipodal structure, depending on the temperature parameter used in the sigmoid loss. Third, our experimental results on synthetic datasets coincide with the theoretical results on the optimal embedding structures.

Chungpa Lee, Jeongheon Oh, Kibok Lee et al.

Supervised contrastive learning (SupCL) has emerged as a prominent approach in representation learning, leveraging both supervised and self-supervised losses. However, achieving an optimal balance between these losses is challenging; failing to do so can lead to class collapse, reducing discrimination among individual embeddings in the same class. In this paper, we present theoretically grounded guidelines for SupCL to prevent class collapse in learned representations. Specifically, we introduce the Simplex-to-Simplex Embedding Model (SSEM), a theoretical framework that models various embedding structures, including all embeddings that minimize the supervised contrastive loss. Through SSEM, we analyze how hyperparameters affect learned representations, offering practical guidelines for hyperparameter selection to mitigate the risk of class collapse. Our theoretical findings are supported by empirical results across synthetic and real-world datasets.

Chungpa Lee, Sehee Lim, Kibok Lee et al.

Contrastive learning operates on a simple yet effective principle: Embeddings of positive pairs are pulled together, while those of negative pairs are pushed apart. In this paper, we propose a unified framework for understanding contrastive learning through the lens of cosine similarity, and present two key theoretical insights derived from this framework. First, in full-batch settings, we show that perfect alignment of positive pairs is unattainable when negative-pair similarities fall below a threshold, and this misalignment can be mitigated by incorporating within-view negative pairs into the objective. Second, in mini-batch settings, smaller batch sizes induce stronger separation among negative pairs in the embedding space, i.e., higher variance in their similarities, which in turn degrades the quality of learned representations compared to full-batch settings. To address this, we propose an auxiliary loss that reduces the variance of negative-pair similarities in mini-batch settings. Empirical results show that incorporating the proposed loss improves performance in small-batch settings.