4.6LGJul 24, 2024
SAfEPaTh: A System-Level Approach for Efficient Power and Thermal Estimation of Convolutional Neural Network AcceleratorYukai Chen, Simei Yang, Debjyoti Bhattacharjee et al.
The design of energy-efficient, high-performance, and reliable Convolutional Neural Network (CNN) accelerators involves significant challenges due to complex power and thermal management issues. This paper introduces SAfEPaTh, a novel system-level approach for accurately estimating power and temperature in tile-based CNN accelerators. By addressing both steady-state and transient-state scenarios, SAfEPaTh effectively captures the dynamic effects of pipeline bubbles in interlayer pipelines, utilizing real CNN workloads for comprehensive evaluation. Unlike traditional methods, it eliminates the need for circuit-level simulations or on-chip measurements. Our methodology leverages TANIA, a cutting-edge hybrid digital-analog tile-based accelerator featuring analog-in-memory computing cores alongside digital cores. Through rigorous simulation results using the ResNet18 model, we demonstrate SAfEPaTh's capability to accurately estimate power and temperature within 500 seconds, encompassing CNN model accelerator mapping exploration and detailed power and thermal estimations. This efficiency and accuracy make SAfEPaTh an invaluable tool for designers, enabling them to optimize performance while adhering to stringent power and thermal constraints. Furthermore, SAfEPaTh's adaptability extends its utility across various CNN models and accelerator architectures, underscoring its broad applicability in the field. This study contributes significantly to the advancement of energy-efficient and reliable CNN accelerator designs, addressing critical challenges in dynamic power and thermal management.
17.2NEMay 5, 2021
Dynamic Reliability Management in Neuromorphic ComputingShihao Song, Jui Hanamshet, Adarsha Balaji et al.
Neuromorphic computing systems uses non-volatile memory (NVM) to implement high-density and low-energy synaptic storage. Elevated voltages and currents needed to operate NVMs cause aging of CMOS-based transistors in each neuron and synapse circuit in the hardware, drifting the transistor's parameters from their nominal values. Aggressive device scaling increases power density and temperature, which accelerates the aging, challenging the reliable operation of neuromorphic systems. Existing reliability-oriented techniques periodically de-stress all neuron and synapse circuits in the hardware at fixed intervals, assuming worst-case operating conditions, without actually tracking their aging at run time. To de-stress these circuits, normal operation must be interrupted, which introduces latency in spike generation and propagation, impacting the inter-spike interval and hence, performance, e.g., accuracy. We propose a new architectural technique to mitigate the aging-related reliability problems in neuromorphic systems, by designing an intelligent run-time manager (NCRTM), which dynamically destresses neuron and synapse circuits in response to the short-term aging in their CMOS transistors during the execution of machine learning workloads, with the objective of meeting a reliability target. NCRTM de-stresses these circuits only when it is absolutely necessary to do so, otherwise reducing the performance impact by scheduling de-stress operations off the critical path. We evaluate NCRTM with state-of-the-art machine learning workloads on a neuromorphic hardware. Our results demonstrate that NCRTM significantly improves the reliability of neuromorphic hardware, with marginal impact on performance.