Muntasir Mamun

Ahmed Alhamadah, Muntasir Mamun, Henry Harms et al.

The onset of Industry 4.0 is rapidly transforming the manufacturing world through the integration of cloud computing, machine learning (ML), artificial intelligence (AI), and universal network connectivity, resulting in performance optimization and increase productivity. Digital Twins (DT) are one such transformational technology that leverages software systems to replicate physical process behavior, representing the physical process in a digital environment. This paper aims to explore the use of photogrammetry (which is the process of reconstructing physical objects into virtual 3D models using photographs) and 3D Scanning techniques to create accurate visual representation of the 'Physical Process', to interact with the ML/AI based behavior models. To achieve this, we have used a readily available consumer device, the iPhone 15 Pro, which features stereo vision capabilities, to capture the depth of an Industry 4.0 system. By processing these images using 3D scanning tools, we created a raw 3D model for 3D modeling and rendering software for the creation of a DT model. The paper highlights the reliability of this method by measuring the error rate in between the ground truth (measurements done manually using a tape measure) and the final 3D model created using this method. The overall mean error is 4.97\% and the overall standard deviation error is 5.54\% between the ground truth measurements and their photogrammetry counterparts. The results from this work indicate that photogrammetry using consumer-grade devices can be an efficient and cost-efficient approach to creating DTs for smart manufacturing, while the approaches flexibility allows for iterative improvements of the models over time.

Yu-Zheng Lin, Muntasir Mamun, Muhtasim Alam Chowdhury et al.

The escalating complexity of modern computing frameworks has resulted in a surge in the cybersecurity vulnerabilities reported to the National Vulnerability Database (NVD) by practitioners. Despite the fact that the stature of NVD is one of the most significant databases for the latest insights into vulnerabilities, extracting meaningful trends from such a large amount of unstructured data is still challenging without the application of suitable technological methodologies. Previous efforts have mostly concentrated on software vulnerabilities; however, a holistic strategy incorporates approaches for mitigating vulnerabilities, score prediction, and a knowledge-generating system that may extract relevant insights from the Common Weakness Enumeration (CWE) and Common Vulnerability Exchange (CVE) databases is notably absent. As the number of hardware attacks on Internet of Things (IoT) devices continues to rapidly increase, we present the Hardware Vulnerability to Weakness Mapping (HW-V2W-Map) Framework, which is a Machine Learning (ML) framework focusing on hardware vulnerabilities and IoT security. The architecture that we have proposed incorporates an Ontology-driven Storytelling framework, which automates the process of updating the ontology in order to recognize patterns and evolution of vulnerabilities over time and provides approaches for mitigating the vulnerabilities. The repercussions of vulnerabilities can be mitigated as a result of this, and conversely, future exposures can be predicted and prevented. Furthermore, our proposed framework utilized Generative Pre-trained Transformer (GPT) Large Language Models (LLMs) to provide mitigation suggestions.