ARMay 19
A Hardware-Based Multi-Stage Dynamic Power Management Architecture for Autonomous Low-Light OperationCharalampos S. Kouzinopoulos, Marcel L. Meli, Martin Schellenberg et al.
The advance of autonomous Smart Sensor Networks and embedded systems for the Internet of Things, powered by photovoltaic energy harvesting, is severely limited by energy efficiency, especially in low-light environments. While Dynamic Power Management is essential for energy conservation, conventional software-based techniques that rely on processor-managed low-power states incur a persistent quiescent current drain. This current becomes the dominant energy sink in energy-scarce conditions, limiting autonomy. The work of this paper addresses this limitation by introducing a robust, hardware-orchestrated dynamic power management architecture that improves existing configurations for battery-based sensor nodes. The proposed architecture achieves a minimal quiescent drain of 452nA, by completely power-gating the microcontroller and all non-essential peripherals, with wake-up orchestrated by an ultra-low-power PMIC, RTC and a novel latch circuit developed specifically for this work. Our evaluation demonstrates that the dynamic power management architecture is significantly more efficient than traditional software-based sleep modes.
CLOct 11, 2025
On-device System of Compositional Multi-tasking in Large Language ModelsOndrej Bohdal, Konstantinos Theodosiadis, Asterios Mpatziakas et al.
Large language models (LLMs) are commonly adapted for diverse downstream tasks via parameter-efficient fine-tuning techniques such as Low-Rank Adapters (LoRA). While adapters can be combined to handle multiple tasks separately, standard approaches struggle when targeting the simultaneous execution of complex tasks, such as generating a translated summary from a long conversation. To address this challenge, we propose a novel approach tailored specifically for compositional multi-tasking scenarios involving summarization and translation. Our technique involves adding a learnable projection layer on top of the combined summarization and translation adapters. This design enables effective integration while maintaining efficiency through reduced computational overhead compared to alternative strategies requiring extensive retraining or sequential processing. We demonstrate the practical viability of our method within an on-device environment by developing an Android app capable of executing compositional tasks seamlessly. Experimental results indicate our solution performs well and is fast in both cloud-based and on-device implementations, highlighting the potential benefits of adopting our framework in real-world applications demanding high-speed operation alongside resource constraints.
CVFeb 25, 2020
A Deep Learning Framework for Simulation and Defect Prediction Applied in MicroelectronicsNikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis et al.
The prediction of upcoming events in industrial processes has been a long-standing research goal since it enables optimization of manufacturing parameters, planning of equipment maintenance and more importantly prediction and eventually prevention of defects. While existing approaches have accomplished substantial progress, they are mostly limited to processing of one dimensional signals or require parameter tuning to model environmental parameters. In this paper, we propose an alternative approach based on deep neural networks that simulates changes in the 3D structure of a monitored object in a batch based on previous 3D measurements. In particular, we propose an architecture based on 3D Convolutional Neural Networks (3DCNN) in order to model the geometric variations in manufacturing parameters and predict upcoming events related to sub-optimal performance. We validate our framework on a microelectronics use-case using the recently published PCB scans dataset where we simulate changes on the shape and volume of glue deposited on an Liquid Crystal Polymer (LCP) substrate before the attachment of integrated circuits (IC). Experimental evaluation examines the impact of different choices in the cost function during training and shows that the proposed method can be efficiently used for defect prediction.
CVFeb 25, 2020
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser ScansNikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis et al.
A common source of defects in manufacturing miniature Printed Circuits Boards (PCB) is the attachment of silicon die or other wire bondable components on a Liquid Crystal Polymer (LCP) substrate. Typically, a conductive glue is dispensed prior to attachment with defects caused either by insufficient or excessive glue. The current practice in electronics industry is to examine the deposited glue by a human operator a process that is both time consuming and inefficient especially in preproduction runs where the error rate is high. In this paper we propose a system that automates fault diagnosis by accurately estimating the volume of glue deposits before and even after die attachment. To this end a modular scanning system is deployed that produces high resolution point clouds whereas the actual estimation of glue volume is performed by (R)egression-Net (RNet), a 3D Convolutional Neural Network (3DCNN). RNet outperforms other deep architectures and is able to estimate the volume either directly from the point cloud of a glue deposit or more interestingly after die attachment when only a small part of glue is visible around each die. The entire methodology is evaluated under operational conditions where the proposed system achieves accurate results without delaying the manufacturing process.