Timothy van der Laan

Zeheng Wang, Fangzhou Wang, Liang Li et al.

Modeling complex semiconductor fabrication processes such as Ohmic contact formation remains challenging due to high-dimensional parameter spaces and limited experimental data. While classical machine learning (CML) approaches have been successful in many domains, their performance degrades in small-sample, nonlinear scenarios. In this work, we investigate quantum machine learning (QML) as an alternative, exploiting quantum kernels to capture intricate correlations from compact datasets. Using only 159 experimental GaN HEMT samples, we develop a quantum kernel-aligned regressor (QKAR) combining a shallow Pauli-Z feature map with a trainable quantum kernel alignment (QKA) layer. All models, including seven baseline CML regressors, are evaluated under a unified PCA-based preprocessing pipeline to ensure a fair comparison. QKAR consistently outperforms classical baselines across multiple metrics (MAE, MSE, RMSE), achieving a mean absolute error of 0.338 Omega mm when validated on experimental data. We further assess noise robustness and generalization through cross-validation and new device fabrication. These findings suggest that carefully constructed QML models could provide predictive advantages in data-constrained semiconductor modeling, offering a foundation for practical deployment on near-term quantum hardware. While challenges remain for both QML and CML, this study demonstrates QML's potential as a complementary approach in complex process modeling tasks.

Zeheng Wang, Timothy van der Laan, Muhammad Usman

The rapid growth of Internet of Things (IoT) devices necessitates efficient data compression techniques to handle the vast amounts of data generated by these devices. Chemiresistive sensor arrays (CSAs), a simple-to-fabricate but crucial component in IoT systems, generate large volumes of data due to their simultaneous multi-sensor operations. Classical principal component analysis (cPCA) methods, a common solution to the data compression challenge, face limitations in preserving critical information during dimensionality reduction. In this study, we present self-adaptive quantum kernel (SAQK) PCA as a superior alternative to enhance information retention. Our findings demonstrate that SAQK PCA outperforms cPCA in various back-end machine-learning tasks, especially in low-dimensional scenarios where access to quantum bits is limited. These results highlight the potential of noisy intermediate-scale quantum (NISQ) computers to revolutionize data processing in real-world IoT applications by improving the efficiency and reliability of CSA data compression and readout, despite the current constraints on qubit availability.

Zeheng Wang, James Scott Cooper, Muhammad Usman et al.

The rapid advancement of Internet of Things (IoT) necessitates the development of optimized nanoparticle-based Chemiresistive Sensor (CRS) arrays that are energy-efficient, specific, and sensitive. This study introduces an optimization strategy that employs a rapid ensemble learning-based model committee approach to achieve these goals. Utilizing machine learning models such as Elastic Net Regression, Random Forests, and XGBoost, among others, the strategy identifies the most impactful sensors in a CRS array for accurate classification. A weighted voting mechanism is introduced to aggregate the models' opinions in sensor selection, thereby setting up two distinct working modes, termed "Blue" and "Green". The Blue mode operates with all sensors for maximum detection capability, while the Green mode selectively activates only key sensors, significantly reducing energy consumption without compromising detection accuracy. The strategy is validated through theoretical calculations and Monte Carlo simulations, demonstrating its effectiveness and accuracy. The employed optimization strategy elevates the detection capability of CRS arrays while also pushing it closer to theoretical limits, promising significant implications for the development of low-cost, easily fabricable next-generation IoT sensor terminals.

Zeheng Wang, Liang Li, Ross C. C. Leon et al.

The semiconductors industry benefits greatly from the integration of Machine Learning (ML)-based techniques in Technology Computer-Aided Design (TCAD) methods. The performance of ML models however relies heavily on the quality and quantity of training datasets. They can be particularly difficult to obtain in the semiconductor industry due to the complexity and expense of the device fabrication. In this paper, we propose a self-augmentation strategy for improving ML-based device modeling using variational autoencoder-based techniques. These techniques require a small number of experimental data points and does not rely on TCAD tools. To demonstrate the effectiveness of our approach, we apply it to a deep neural network-based prediction task for the Ohmic resistance value in Gallium Nitride devices. A 70% reduction in mean absolute error when predicting experimental results is achieved. The inherent flexibility of our approach allows easy adaptation to various tasks, thus making it highly relevant to many applications of the semiconductor industry.