Emilio Dolgener Cantú

2papers

2 Papers

6.2CVAug 6, 2025
On the effectiveness of multimodal privileged knowledge distillation in two vision transformer based diagnostic applications

Simon Baur, Alexandra Benova, Emilio Dolgener Cantú et al.

Deploying deep learning models in clinical practice often requires leveraging multiple data modalities, such as images, text, and structured data, to achieve robust and trustworthy decisions. However, not all modalities are always available at inference time. In this work, we propose multimodal privileged knowledge distillation (MMPKD), a training strategy that utilizes additional modalities available solely during training to guide a unimodal vision model. Specifically, we used a text-based teacher model for chest radiographs (MIMIC-CXR) and a tabular metadata-based teacher model for mammography (CBIS-DDSM) to distill knowledge into a vision transformer student model. We show that MMPKD can improve the resulting attention maps' zero-shot capabilities of localizing ROI in input images, while this effect does not generalize across domains, as contrarily suggested by prior research.

3.6CVJun 12, 2025
Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection

Emílio Dolgener Cantú, Rolf Klemens Wittmann, Oliver Abdeen et al.

Quality management in semiconductor manufacturing often relies on template matching with known golden standards. For Indium-Phosphide (InP) multi-project wafer manufacturing, low production scale and high design variability lead to such golden standards being typically unavailable. Defect detection, in turn, is manual and labor-intensive. This work addresses this challenge by proposing a methodology to generate a synthetic golden standard using Deep Neural Networks, trained to simulate photo-realistic InP wafer images from CAD data. We evaluate various training objectives and assess the quality of the simulated images on both synthetic data and InP wafer photographs. Our deep-learning-based method outperforms a baseline decision-tree-based approach, enabling the use of a 'simulated golden die' from CAD plans in any user-defined region of a wafer for more efficient defect detection. We apply our method to a template matching procedure, to demonstrate its practical utility in surface defect detection.