IVJan 29, 2024Code
Data-Driven Filter Design in FBP: Transforming CT Reconstruction with Trainable Fourier SeriesYipeng Sun, Linda-Sophie Schneider, Fuxin Fan et al.
In this study, we introduce a Fourier series-based trainable filter for computed tomography (CT) reconstruction within the filtered backprojection (FBP) framework. This method overcomes the limitation in noise reduction by optimizing Fourier series coefficients to construct the filter, maintaining computational efficiency with minimal increment for the trainable parameters compared to other deep learning frameworks. Additionally, we propose Gaussian edge-enhanced (GEE) loss function that prioritizes the $L_1$ norm of high-frequency magnitudes, effectively countering the blurring problems prevalent in mean squared error (MSE) approaches. The model's foundation in the FBP algorithm ensures excellent interpretability, as it relies on a data-driven filter with all other parameters derived through rigorous mathematical procedures. Designed as a plug-and-play solution, our Fourier series-based filter can be easily integrated into existing CT reconstruction models, making it an adaptable tool for a wide range of practical applications. Code and data are available at https://github.com/sypsyp97/Trainable-Fourier-Series.
CVJan 29, 2024
A 2D Sinogram-Based Approach to Defect Localization in Computed TomographyYuzhong Zhou, Linda-Sophie Schneider, Fuxin Fan et al.
The rise of deep learning has introduced a transformative era in the field of image processing, particularly in the context of computed tomography. Deep learning has made a significant contribution to the field of industrial Computed Tomography. However, many defect detection algorithms are applied directly to the reconstructed domain, often disregarding the raw sensor data. This paper shifts the focus to the use of sinograms. Within this framework, we present a comprehensive three-step deep learning algorithm, designed to identify and analyze defects within objects without resorting to image reconstruction. These three steps are defect segmentation, mask isolation, and defect analysis. We use a U-Net-based architecture for defect segmentation. Our method achieves the Intersection over Union of 92.02% on our simulated data, with an average position error of 1.3 pixels for defect detection on a 512-pixel-wide detector.