2.0CVAug 2, 2024
Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence ScoringMatthew J. Lynch, Ryan Jacobs, Gabriella Bruno et al.
The integration of machine learning (ML) models enhances the efficiency, affordability, and reliability of feature detection in microscopy, yet their development and applicability are hindered by the dependency on scarce and often flawed manually labeled datasets and a lack of domain awareness. We addressed these challenges by creating a physics-based synthetic image and data generator, resulting in a machine learning model that achieves comparable precision (0.86), recall (0.63), F1 scores (0.71), and engineering property predictions (R2=0.82) to a model trained on human-labeled data. We enhanced both models by using feature prediction confidence scores to derive an image-wide confidence metric, enabling simple thresholding to eliminate ambiguous and out-of-domain images resulting in performance boosts of 5-30% with a filtering-out rate of 25%. Our study demonstrates that synthetic data can eliminate human reliance in ML and provides a means for domain awareness in cases where many feature detections per image are needed.
2.6CVOct 15, 2021Code
Performance, Successes and Limitations of Deep Learning Semantic Segmentation of Multiple Defects in Transmission Electron MicrographsRyan Jacobs, Mingren Shen, Yuhan Liu et al.
In this work, we perform semantic segmentation of multiple defect types in electron microscopy images of irradiated FeCrAl alloys using a deep learning Mask Regional Convolutional Neural Network (Mask R-CNN) model. We conduct an in-depth analysis of key model performance statistics, with a focus on quantities such as predicted distributions of defect shapes, defect sizes, and defect areal densities relevant to informing modeling and understanding of irradiated Fe-based materials properties. To better understand the performance and present limitations of the model, we provide examples of useful evaluation tests which include a suite of random splits, and dataset size-dependent and domain-targeted cross validation tests. Overall, we find that the current model is a fast, effective tool for automatically characterizing and quantifying multiple defect types in microscopy images, with a level of accuracy on par with human domain expert labelers. More specifically, the model can achieve average defect identification F1 scores as high as 0.8, and, based on random cross validation, have low overall average (+/- standard deviation) defect size and density percentage errors of 7.3 (+/- 3.8)% and 12.7 (+/- 5.3)%, respectively. Further, our model predicts the expected material hardening to within 10-20 MPa (about 10% of total hardening), which is about the same error level as experiments. Our targeted evaluation tests also suggest the best path toward improving future models is not expanding existing databases with more labeled images but instead data additions that target weak points of the model domain, such as images from different microscopes, imaging conditions, irradiation environments, and alloy types. Finally, we discuss the first phase of an effort to provide an easy-to-use, open-source object detection tool to the broader community for identifying defects in new images.
Predicting Performance of Object Detection Models in Electron Microscopy Using Random ForestsNi Li, Ryan Jacobs, Matthew Lynch et al.
Quantifying prediction uncertainty when applying object detection models to new, unlabeled datasets is critical in applied machine learning. This study introduces an approach to estimate the performance of deep learning-based object detection models for quantifying defects in transmission electron microscopy (TEM) images, focusing on detecting irradiation-induced cavities in TEM images of metal alloys. We developed a random forest regression model that predicts the object detection F1 score, a statistical metric used to evaluate the ability to accurately locate and classify objects of interest. The random forest model uses features extracted from the predictions of the object detection model whose uncertainty is being quantified, enabling fast prediction on new, unlabeled images. The mean absolute error (MAE) for predicting F1 of the trained model on test data is 0.09, and the $R^2$ score is 0.77, indicating there is a significant correlation between the random forest regression model predicted and true defect detection F1 scores. The approach is shown to be robust across three distinct TEM image datasets with varying imaging and material domains. Our approach enables users to estimate the reliability of a defect detection and segmentation model predictions and assess the applicability of the model to their specific datasets, providing valuable information about possible domain shifts and whether the model needs to be fine-tuned or trained on additional data to be maximally effective for the desired use case.
8.0CVAug 19, 2021
Multi defect detection and analysis of electron microscopy images with deep learningMingren Shen, Guanzhao Li, Dongxia Wu et al.
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.
A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion IrradiationsMingren Shen, Guanzhao Li, Dongxia Wu et al.
Videos captured using Transmission Electron Microscopy (TEM) can encode details regarding the morphological and temporal evolution of a material by taking snapshots of the microstructure sequentially. However, manual analysis of such video is tedious, error-prone, unreliable, and prohibitively time-consuming if one wishes to analyze a significant fraction of frames for even videos of modest length. In this work, we developed an automated TEM video analysis system for microstructural features based on the advanced object detection model called YOLO and tested the system on an in-situ ion irradiation TEM video of dislocation loops formed in a FeCrAl alloy. The system provides analysis of features observed in TEM including both static and dynamic properties using the YOLO-based defect detection module coupled to a geometry analysis module and a dynamic tracking module. Results show that the system can achieve human comparable performance with an F1 score of 0.89 for fast, consistent, and scalable frame-level defect analysis. This result is obtained on a real but exceptionally clean and stable data set and more challenging data sets may not achieve this performance. The dynamic tracking also enabled evaluation of individual defect evolution like per defect growth rate at a fidelity never before achieved using common human analysis methods. Our work shows that automatically detecting and tracking interesting microstructures and properties contained in TEM videos is viable and opens new doors for evaluating materials dynamics.