Rui Xin

Rui Xin, Niloofar Mireshghallah, Shuyue Stella Li et al.

Sanitizing sensitive text data typically involves removing personally identifiable information (PII) or generating synthetic data under the assumption that these methods adequately protect privacy; however, their effectiveness is often only assessed by measuring the leakage of explicit identifiers but ignoring nuanced textual markers that can lead to re-identification. We challenge the above illusion of privacy by proposing a new framework that evaluates re-identification attacks to quantify individual privacy risks upon data release. Our approach shows that seemingly innocuous auxiliary information -- such as routine social activities -- can be used to infer sensitive attributes like age or substance use history from sanitized data. For instance, we demonstrate that Azure's commercial PII removal tool fails to protect 74\% of information in the MedQA dataset. Although differential privacy mitigates these risks to some extent, it significantly reduces the utility of the sanitized text for downstream tasks. Our findings indicate that current sanitization techniques offer a \textit{false sense of privacy}, highlighting the need for more robust methods that protect against semantic-level information leakage.

Wei Sun, Weixia Zhang, Linhan Cao et al.

This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing. The challenge is motivated by two key limitations of existing industrial defect inspection systems: (1) current deep learning-based methods often suffer significant performance degradation when deployed in unseen production scenarios, and (2) most benchmarks neglect severity-aware assessment, which is critical for risk control and yield optimization. To address these limitations, we design two complementary tracks: Track 1 (Cross-Scenario Defect Detection) targets accurate defect detection, localization, and classification across diverse unseen production environments; Track 2 (Fine-Grained Severity Grading) requires assigning each detected defect an industry-standard severity level, including Acceptable, Marginal NG, NG, and Gross NG. We construct a large-scale industrial dataset of high-resolution microscopic images spanning seven representative defect categories, comprising over 3,800 images with pixel-level instance annotations for Track 1 and over 2,600 images with severity-grade labels for Track 2. The challenge attracted 86 registered participants with 130 submissions; during the final testing phase, 21 teams submitted results and 12 teams provided models with technical reports. The resulting benchmark, together with the diverse and effective solutions contributed by participating teams, sets a new standard for industrial defect analysis research.

Leonardo Mariani, Cristina Monni, Mauro Pezzé et al.

By leveraging large clusters of commodity hardware, the Cloud offers great opportunities to optimize the operative costs of software systems, but impacts significantly on the reliability of software applications. The lack of control of applications over Cloud execution environments largely limits the applicability of state-of-the-art approaches that address reliability issues by relying on heavyweight training with injected faults. In this paper, we propose \emph(LOUD}, a lightweight fault localization approach that relies on positive training only, and can thus operate within the constraints of Cloud systems. \emph{LOUD} relies on machine learning and graph theory. It trains machine learning models with correct executions only, and compensates the inaccuracy that derives from training with positive samples, by elaborating the outcome of machine learning techniques with graph theory algorithms. The experimental results reported in this paper confirm that \emph{LOUD} can localize faults with high precision, by relying only on a lightweight positive training.