Rule-based Test Generation with Mind Maps
This addresses test generation challenges in the smart card domain, but it is incremental as it builds on existing rule-based and mind map techniques.
The paper tackles the problem of generating tests for smart card systems by formalizing test selection criteria and developing a rule-based test generation architecture using mind maps, reporting on industrial application experiences at Giesecke & Devrient GmbH.
This paper introduces basic concepts of rule based test generation with mind maps, and reports experiences learned from industrial application of this technique in the domain of smart card testing by Giesecke & Devrient GmbH over the last years. It describes the formalization of test selection criteria used by our test generator, our test generation architecture and test generation framework.