Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law-Johnson-noise secure key exchange
This addresses error mitigation for secure key exchange in quantum cryptography, but appears incremental as it builds on existing KLJN schemes.
The paper tackled bit errors in the Kirchhoff-law-Johnson-noise (KLJN) key distribution by analyzing current and voltage measurement modes, showing that error probability decays exponentially with bit exchange period, and combining these modes yields superior fidelity.
We classify and analyze bit errors in the current measurement mode of the Kirchhoff-law-Johnson-noise (KLJN) key distribution. The error probability decays exponentially with increasing bit exchange period and fixed bandwidth, which is similar to the error probability decay in the voltage measurement mode. We also analyze the combination of voltage and current modes for error removal. In this combination method, the error probability is still an exponential function that decays with the duration of the bit exchange period, but it has superior fidelity to the former schemes.