Structured illumination microscopy image reconstruction algorithm
This work addresses the problem for researchers in microscopy by compiling scattered theoretical information and offering a practical tool, but it is incremental as it reviews and integrates existing methods rather than introducing new ones.
The authors tackled the lack of a comprehensive resource for structured illumination microscopy (SIM) reconstruction algorithms by collecting essential theoretical details and providing an open-source code (OpenSIM) for interactive parameter study, making these tools accessible to readers for the first time.
Structured illumination microscopy (SIM) is a very important super-resolution microscopy technique, which provides high speed super-resolution with about two-fold spatial resolution enhancement. Several attempts aimed at improving the performance of SIM reconstruction algorithm have been reported. However, most of these highlight only one specific aspect of the SIM reconstruction -- such as the determination of the illumination pattern phase shift accurately -- whereas other key elements -- such as determination of modulation factor, estimation of object power spectrum, Wiener filtering frequency components with inclusion of object power spectrum information, translocating and the merging of the overlapping frequency components -- are usually glossed over superficially. In addition, most of the work reported lie scattered throughout the literature and a comprehensive review of the theoretical background is found lacking. The purpose of the present work is two-fold: 1) to collect the essential theoretical details of SIM algorithm at one place, thereby making them readily accessible to readers for the first time; and 2) to provide an open source SIM reconstruction code (named OpenSIM), which enables users to interactively vary the code parameters and study it's effect on reconstructed SIM image.