Lower Lipschitz Bounds for Phase Retrieval from Locally Supported Measurements
Provides fundamental limits on noise robustness for ptychographic imaging, informing probe design and measurement requirements for high-speed, high-resolution imaging of integrated circuits.
This paper derives lower Lipschitz bounds for phase retrieval from locally supported measurements, showing that accurate recovery of high-resolution images with highly localized probes requires an extremely large number of measurements to be robust to worst-case noise, regardless of the algorithm used.
In this short note, we consider the worst case noise robustness of any phase retrieval algorithm which aims to reconstruct all nonvanishing vectors $\mathbf{x} \in \mathbb{C}^d$ (up to a single global phase multiple) from the magnitudes of an arbitrary collection of local correlation measurements. Examples of such measurements include both spectrogram measurements of $\mathbf{x}$ using locally supported windows and masked Fourier transform intensity measurements of $\mathbf{x}$ using bandlimited masks. As a result, the robustness results considered herein apply to a wide range of both ptychographic and Fourier ptychographic imaging scenarios. In particular, the main results imply that the accurate recovery of high-resolution images of extremely large samples using highly localized probes is likely to require an extremely large number of measurements in order to be robust to worst case measurement noise, independent of the recovery algorithm employed. Furthermore, recent pushes to achieve high-speed and high-resolution ptychographic imaging of integrated circuits for process verification and failure analysis will likely need to carefully balance probe design (e.g., their effective time-frequency support) against the total number of measurements acquired in order for their imaging techniques to be stable to measurement noise, no matter what reconstruction algorithms are applied.