A New SVDD-Based Multivariate Non-parametric Process Capability Index
This addresses the need for more flexible quality control tools in manufacturing and related fields, though it appears incremental as it builds on existing SVDD-based methods.
The paper tackled the problem of unrealistic distributional assumptions in existing process capability indices by proposing a new multivariate non-parametric index that works when the process distribution is unknown or non-normal.
Process capability index (PCI) is a commonly used statistic to measure ability of a process to operate within the given specifications or to produce products which meet the required quality specifications. PCI can be univariate or multivariate depending upon the number of process specifications or quality characteristics of interest. Most PCIs make distributional assumptions which are often unrealistic in practice. This paper proposes a new multivariate non-parametric process capability index. This index can be used when distribution of the process or quality parameters is either unknown or does not follow commonly used distributions such as multivariate normal.