Revisiting Robust Model Fitting Using Truncated Loss
This work addresses robust fitting in low-level vision, offering improved performance for applications like registration, though it appears incremental as it revisits and extends existing truncated loss approaches.
The paper tackles robust model fitting by proposing a formulation using truncated loss for simultaneous inlier identification and model estimation, showing it achieves lower residual than maximum consensus methods and outperforms RANSAC and state-of-the-art methods in 2D/3D registration, especially at high outlier ratios.
Robust fitting is a fundamental problem in low-level vision, which is typically achieved by maximum consensus (MC) estimators to identify inliers first or by M-estimators directly. While these two methods are discriminately preferred in different applications, truncated loss based M-estimators are similar to MC as they can also identify inliers. This work revisits a formulation that achieves simultaneous inlier identification and model estimation (SIME) using truncated loss. It has a generalized form adapts to both linear and nonlinear residual models. We show that as SIME takes fitting residual into account in finding inliers, its lowest achievable residual in model fitting is lower than that of MC robust fitting. Then, an alternating minimization (AM) algorithm is employed to solve the SIME formulation. Meanwhile, a semidefinite relaxation (SDR) embedded AM algorithm is developed in order to ease the high nonconvexity of the SIME formulation. Furthermore, the new algorithms are applied to various 2D/3D registration problems. Experimental results show that the new algorithms significantly outperform RANSAC and deterministic approximate MC methods at high outlier ratios. Besides, in rotation and Euclidean registration problems, the new algorithms also compare favorably with state-of-the-art registration methods, especially in high noise and outliers. Code is available at \textit{https://github.com/FWen/mcme.git}.