Phase Sampling Profilometry
This addresses the need for high-speed 3D shape measurement in applications like robotics or inspection, though it appears incremental as an extension of phase measuring profilometry.
The paper tackles the problem of 3D surface imaging of moving objects by introducing phase sampling profilometry (PSP), which calculates phase unambiguously in the spatial-frequency domain using only one pattern image, enabling robust single-shot measurement.
Structured light 3D surface imaging is a school of techniques in which structured light patterns are used for measuring the depth map of the object. Among all the designed structured light patterns, phase pattern has become most popular because of its high resolution and high accuracy. Accordingly, phase measuring profolimetry (PMP) has become the mainstream of structured light technology. In this letter, we introduce the concept of phase sampling profilometry (PSP) that calculates the phase unambiguously in the spatial-frequency domain with only one pattern image. Therefore, PSP is capable of measuring the 3D shapes of the moving objects robustly with single-shot.