Development and accuracy evaluation of Coded Phase-shift 3D scanner
This work is incremental, focusing on performance assessment for structured-light 3D scanners, which could aid in understanding their basic working and evaluation methods.
The paper tackled the development of a structured light 3D scanner using a Coded Phase-shift technique, combining binary-coded and sinusoidal phase-shifted fringe patterns, and evaluated its measurement accuracy and precision, though no concrete numbers were provided in the abstract.
In this paper, we provide an overview of development of a structured light 3D-scanner based on combination of binary-coded patterns and sinusoidal phase-shifted fringe patterns called Coded Phase-shift technique. Further, we describe the experiments performed to evaluate measurement accuracy and precision of the developed system. A study of this kind is expected to be helpful in understanding the basic working of current structured-light 3D scanners and the approaches followed for their performance assessment.