A No-Reference Deep Learning Quality Assessment Method for Super-resolution Images Based on Frequency Maps
This work addresses the need for accurate quality assessment in super-resolution applications, but it is incremental as it builds on existing IQA methods with a novel frequency-based approach.
The paper tackles the problem of assessing the quality of super-resolution images, which suffer from diverse artifacts not well-handled by existing methods, by proposing a no-reference deep learning approach based on frequency maps that outperforms all compared models on three SRQA databases.
To support the application scenarios where high-resolution (HR) images are urgently needed, various single image super-resolution (SISR) algorithms are developed. However, SISR is an ill-posed inverse problem, which may bring artifacts like texture shift, blur, etc. to the reconstructed images, thus it is necessary to evaluate the quality of super-resolution images (SRIs). Note that most existing image quality assessment (IQA) methods were developed for synthetically distorted images, which may not work for SRIs since their distortions are more diverse and complicated. Therefore, in this paper, we propose a no-reference deep-learning image quality assessment method based on frequency maps because the artifacts caused by SISR algorithms are quite sensitive to frequency information. Specifically, we first obtain the high-frequency map (HM) and low-frequency map (LM) of SRI by using Sobel operator and piecewise smooth image approximation. Then, a two-stream network is employed to extract the quality-aware features of both frequency maps. Finally, the features are regressed into a single quality value using fully connected layers. The experimental results show that our method outperforms all compared IQA models on the selected three super-resolution quality assessment (SRQA) databases.