Meta-Registration: Learning Test-Time Optimization for Single-Pair Image Registration
This work addresses time-critical image guidance applications in medical imaging, such as for prostate cancer patients, where training data is limited, offering an incremental improvement over prior methods.
The paper tackles the problem of medical image registration by formulating it as a meta-learning algorithm to improve test-time optimization on single image pairs, resulting in significantly better performance than existing learning-based methods and comparable accuracy to classical iterative methods in much less time.
Neural networks have been proposed for medical image registration by learning, with a substantial amount of training data, the optimal transformations between image pairs. These trained networks can further be optimized on a single pair of test images - known as test-time optimization. This work formulates image registration as a meta-learning algorithm. Such networks can be trained by aligning the training image pairs while simultaneously improving test-time optimization efficacy; tasks which were previously considered two independent training and optimization processes. The proposed meta-registration is hypothesized to maximize the efficiency and effectiveness of the test-time optimization in the "outer" meta-optimization of the networks. For image guidance applications that often are time-critical yet limited in training data, the potentially gained speed and accuracy are compared with classical registration algorithms, registration networks without meta-learning, and single-pair optimization without test-time optimization data. Experiments are presented in this paper using clinical transrectal ultrasound image data from 108 prostate cancer patients. These experiments demonstrate the effectiveness of a meta-registration protocol, which yields significantly improved performance relative to existing learning-based methods. Furthermore, the meta-registration achieves comparable results to classical iterative methods in a fraction of the time, owing to its rapid test-time optimization process.