Deep Metric Learning for Unsupervised Remote Sensing Change Detection
This work addresses the challenge of domain gaps and data annotation requirements in remote sensing change detection, offering a more transferable solution for applications like land use analysis and disaster response, though it is incremental as it builds on existing metric learning principles.
The paper tackles the problem of remote sensing change detection by proposing an unsupervised deep metric learning method that avoids the need for large annotated datasets and addresses domain transfer issues, achieving significant improvements over state-of-the-art supervised and unsupervised methods on three datasets.
Remote Sensing Change Detection (RS-CD) aims to detect relevant changes from Multi-Temporal Remote Sensing Images (MT-RSIs), which aids in various RS applications such as land cover, land use, human development analysis, and disaster response. The performance of existing RS-CD methods is attributed to training on large annotated datasets. Furthermore, most of these models are less transferable in the sense that the trained model often performs very poorly when there is a domain gap between training and test datasets. This paper proposes an unsupervised CD method based on deep metric learning that can deal with both of these issues. Given an MT-RSI, the proposed method generates corresponding change probability map by iteratively optimizing an unsupervised CD loss without training it on a large dataset. Our unsupervised CD method consists of two interconnected deep networks, namely Deep-Change Probability Generator (D-CPG) and Deep-Feature Extractor (D-FE). The D-CPG is designed to predict change and no change probability maps for a given MT-RSI, while D-FE is used to extract deep features of MT-RSI that will be further used in the proposed unsupervised CD loss. We use transfer learning capability to initialize the parameters of D-FE. We iteratively optimize the parameters of D-CPG and D-FE for a given MT-RSI by minimizing the proposed unsupervised ``similarity-dissimilarity loss''. This loss is motivated by the principle of metric learning where we simultaneously maximize the distance between change pair-wise pixels while minimizing the distance between no-change pair-wise pixels in bi-temporal image domain and their deep feature domain. The experiments conducted on three CD datasets show that our unsupervised CD method achieves significant improvements over the state-of-the-art supervised and unsupervised CD methods. Code available at https://github.com/wgcban/Metric-CD