Sequential Experimental Design for Spectral Measurement: Active Learning Using a Parametric Model
This addresses the need for faster and more efficient spectral measurements in fields like X-ray photoelectron spectroscopy, though it is incremental as it builds on prior active learning approaches.
The study tackled the problem of reducing measurement time in spectral experiments by proposing a sequential experimental design using active learning with parametric models, demonstrating improved accuracy in model selection and parameter estimation while cutting measurement time compared to existing methods.
In this study, we demonstrate a sequential experimental design for spectral measurements by active learning using parametric models as predictors. In spectral measurements, it is necessary to reduce the measurement time because of sample fragility and high energy costs. To improve the efficiency of experiments, sequential experimental designs are proposed, in which the subsequent measurement is designed by active learning using the data obtained before the measurement. Conventionally, parametric models are employed in data analysis; when employed for active learning, they are expected to afford a sequential experimental design that improves the accuracy of data analysis. However, due to the complexity of the formulas, a sequential experimental design using general parametric models has not been realized. Therefore, we applied Bayesian inference-based data analysis using the exchange Monte Carlo method to realize a sequential experimental design with general parametric models. In this study, we evaluated the effectiveness of the proposed method by applying it to Bayesian spectral deconvolution and Bayesian Hamiltonian selection in X-ray photoelectron spectroscopy. Using numerical experiments with artificial data, we demonstrated that the proposed method improves the accuracy of model selection and parameter estimation while reducing the measurement time compared with the results achieved without active learning or with active learning using the Gaussian process regression.