Nano1D: An accurate Computer Vision software for analysis and segmentation of low-dimensional nanostructures
This addresses the need for accurate, automated analysis of nanoparticles in microscopy for researchers in materials science and nanotechnology, offering a significant improvement over existing methods that struggle with overlapping objects.
The paper tackles the problem of autonomous quantitative analysis of low-dimensional nanostructures in microscopy images, presenting Nano1D, a physics-based computational model that achieves over 99% accuracy in segmenting and analyzing overlapping objects like nanowires and nanotubes.
Nanoparticles in microscopy images are usually analyzed qualitatively or manually and there is a need for autonomous quantitative analysis of these objects. In this paper, we present a physics-based computational model for accurate segmentation and geometrical analysis of one-dimensional deformable overlapping objects from microscopy images. This model, named Nano1D, has four steps of preprocessing, segmentation, separating overlapped objects and geometrical measurements. The model is tested on SEM images of Ag and Au nanowire taken from different microscopes, and thermally fragmented Ag nanowires transformed into nanoparticles with different lengths, diameters, and population densities. It successfully segments and analyzes their geometrical characteristics including lengths and average diameter. The function of the algorithm is not undermined by the size, number, density, orientation and overlapping of objects in images. The main strength of the model is shown to be its ability to segment and analyze overlapping objects successfully with more than 99% accuracy, while current machine learning and computational models suffer from inaccuracy and inability to segment overlapping objects. Benefiting from a graphical user interface, Nano1D can analyze 1D nanoparticles including nanowires, nanotubes, nanorods in addition to other 1D features of microstructures like microcracks, dislocations etc.