OOD Aware Supervised Contrastive Learning
This addresses the crucial problem of safe model deployment by improving OOD detection, but it is incremental as it builds on existing supervised contrastive learning methods.
The paper tackles the problem of Out-of-Distribution (OOD) detection for machine learning models by proposing a supervised contrastive learning approach with additional contrast terms and pseudo-OOD feature generation, achieving state-of-the-art results on common benchmarks.
Out-of-Distribution (OOD) detection is a crucial problem for the safe deployment of machine learning models identifying samples that fall outside of the training distribution, i.e. in-distribution data (ID). Most OOD works focus on the classification models trained with Cross Entropy (CE) and attempt to fix its inherent issues. In this work we leverage powerful representation learned with Supervised Contrastive (SupCon) training and propose a holistic approach to learn a classifier robust to OOD data. We extend SupCon loss with two additional contrast terms. The first term pushes auxiliary OOD representations away from ID representations without imposing any constraints on similarities among auxiliary data. The second term pushes OOD features far from the existing class prototypes, while pushing ID representations closer to their corresponding class prototype. When auxiliary OOD data is not available, we propose feature mixing techniques to efficiently generate pseudo-OOD features. Our solution is simple and efficient and acts as a natural extension of the closed-set supervised contrastive representation learning. We compare against different OOD detection methods on the common benchmarks and show state-of-the-art results.