Crossed-IoT device portability of Electromagnetic Side Channel Analysis: Challenges and Dataset
It addresses a specific limitation in IoT forensics for security analysts, but is incremental as it builds on existing EM-SCA methods with a focus on dataset creation and transfer learning.
This study tackles the problem of device variability limiting the accuracy of electromagnetic side-channel analysis (EM-SCA) for IoT forensics, showing that transfer learning can improve results for cross-device portability and contributing a new dataset for deep learning models.
IoT (Internet of Things) refers to the network of interconnected physical devices, vehicles, home appliances, and other items embedded with sensors, software, and connectivity, enabling them to collect and exchange data. IoT Forensics is collecting and analyzing digital evidence from IoT devices to investigate cybercrimes, security breaches, and other malicious activities that may have taken place on these connected devices. In particular, EM-SCA has become an essential tool for IoT forensics due to its ability to reveal confidential information about the internal workings of IoT devices without interfering these devices or wiretapping their networks. However, the accuracy and reliability of EM-SCA results can be limited by device variability, environmental factors, and data collection and processing methods. Besides, there is very few research on these limitations that affects significantly the accuracy of EM-SCA approaches for the crossed-IoT device portability as well as limited research on the possible solutions to address such challenge. Therefore, this empirical study examines the impact of device variability on the accuracy and reliability of EM-SCA approaches, in particular machine-learning (ML) based approaches for EM-SCA. We firstly presents the background, basic concepts and techniques used to evaluate the limitations of current EM-SCA approaches and datasets. Our study then addresses one of the most important limitation, which is caused by the multi-core architecture of the processors (SoC). We present an approach to collect the EM-SCA datasets and demonstrate the feasibility of using transfer learning to obtain more meaningful and reliable results from EM-SCA in IoT forensics of crossed-IoT devices. Our study moreover contributes a new dataset for using deep learning models in analysing Electromagnetic Side-Channel data with regards to the cross-device portability matter.