Near-Isotropic Sub-Ångstrom 3D Resolution Phase Contrast Imaging Achieved by End-to-End Ptychographic Electron Tomography
This work addresses the challenge of 3D atomic resolution imaging for materials science, offering a novel approach to overcome limitations like the missing wedge effect, though it appears incremental as it builds on existing ptychographic methods.
The paper tackled the problem of achieving high-resolution 3D atomic imaging in electron microscopy by developing an end-to-end ptychographic tomography method, which demonstrated recovery of both heavy and light atoms in simulation and sub-Ångstrom resolution experimentally on a Te nanoparticle.
Three-dimensional atomic resolution imaging using transmission electron microscopes is a unique capability that requires challenging experiments. Linear electron tomography methods are limited by the missing wedge effect, requiring a high tilt range. Multislice ptychography can achieve deep sub-Ångstrom resolution in the transverse direction, but the depth resolution is limited to 2 to 3 nanometers. In this paper, we propose and demonstrate an end-to-end approach to reconstructing the electrostatic potential volume of the sample directly from the 4D-STEM datasets. End-to-end multi-slice ptychographic tomography recovers several slices at each tomography tilt angle and compensates for the missing wedge effect. The algorithm is initially tested in simulation with a Pt@$\mathrm{Al_2O_3}$ core-shell nanoparticle, where both heavy and light atoms are recovered in 3D from an unaligned 4D-STEM tilt series with a restricted tilt range of 90 degrees. We also demonstrate the algorithm experimentally, recovering a Te nanoparticle with sub-Ångstrom resolution.