Understanding and Mitigating Errors of LLM-Generated RTL Code
This addresses errors in LLM-based hardware design code generation, which is an incremental improvement through systematic error analysis and correction methods.
The paper tackled the problem of low success rates in LLM-generated RTL code by analyzing error causes and implementing targeted correction techniques, resulting in a framework that achieved 91.0% accuracy on the VerilogEval benchmark, a 32.7% improvement over the baseline.
Despite the promising potential of large language model (LLM) based register-transfer-level (RTL) code generation, the overall success rate remains unsatisfactory. Errors arise from various factors, with limited understanding of specific failure causes hindering improvement. To address this, we conduct a comprehensive error analysis and manual categorization. Our findings reveal that most errors stem not from LLM reasoning limitations, but from insufficient RTL programming knowledge, poor understanding of circuit concepts, ambiguous design descriptions, or misinterpretation of complex multimodal inputs. Leveraging in-context learning, we propose targeted error correction techniques. Specifically, we construct a domain-specific knowledge base and employ retrieval-augmented generation (RAG) to supply necessary RTL knowledge. To mitigate ambiguity errors, we introduce design description rules and implement a rule-checking mechanism. For multimodal misinterpretation, we integrate external tools to convert inputs into LLM-compatible meta-formats. For remaining errors, we adopt an iterative debugging loop (simulation-error localization-correction). Integrating these techniques into an LLM-based framework significantly improves performance. We incorporate these error correction techniques into a foundational LLM-based RTL code generation framework, resulting in significantly improved performance. Experimental results show that our enhanced framework achieves 91.0\% accuracy on the VerilogEval benchmark, surpassing the baseline code generation approach by 32.7\%, demonstrating the effectiveness of our methods.