LGFLU-DYNNov 21, 2025

Periodicity-Enforced Neural Network for Designing Deterministic Lateral Displacement Devices

arXiv:2511.17754v1
Originality Incremental advance
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This work addresses the need for efficient and accurate microfluidic device design for cancer detection, representing a domain-specific incremental improvement over existing surrogate modeling approaches.

The paper tackled the problem of designing Deterministic Lateral Displacement (DLD) devices for cancer detection by introducing a periodicity-enforced neural network that ensures exact periodic boundary conditions, achieving a 0.478% critical diameter error and an 85.4% improvement over baseline methods.

Deterministic Lateral Displacement (DLD) devices enable liquid biopsy for cancer detection by separating circulating tumor cells (CTCs) from blood samples based on size, but designing these microfluidic devices requires computationally expensive Navier-Stokes simulations and particle-tracing analyses. While recent surrogate modeling approaches using deep learning have accelerated this process, they often inadequately handle the critical periodic boundary conditions of DLD unit cells, leading to cumulative errors in multi-unit device predictions. This paper introduces a periodicity-enforced surrogate modeling approach that incorporates periodic layers, neural network components that guarantee exact periodicity without penalty terms or output modifications, into deep learning architectures for DLD device design. The proposed method employs three sub-networks to predict steady-state, non-dimensional velocity and pressure fields (u, v, p) rather than directly predicting critical diameters or particle trajectories, enabling complete flow field characterization and enhanced design flexibility. Periodic layers ensure exact matching of flow variables across unit cell boundaries through architectural enforcement rather than soft penalty-based approaches. Validation on 120 CFD-generated geometries demonstrates that the periodic layer implementation achieves 0.478% critical diameter error while maintaining perfect periodicity consistency, representing an 85.4% improvement over baseline methods. The approach enables efficient and accurate DLD device design with guaranteed boundary condition satisfaction for multi-unit device applications.

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