EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processors
This addresses the challenge of improving reliability for quantum computing architects and compiler designers, offering a novel framework that goes beyond incremental improvements by providing actionable insights from physical design.
The paper tackles the problem of predicting architectural reliability in superconducting quantum processors by linking electromagnetic design to execution-level behavior, achieving 100% agreement with error trends and revealing over 10X robustness differences among edges with identical error rates.
As superconducting processors scale, understanding how physical layout shapes qubit interactions is essential for architectural reliability. Existing methods offer limited insight into how electromagnetic design choices translate into execution-level behavior. We present EPAR, an electromagnetic-to-architecture framework that predicts robustness early directly from physical design by reconstructing how design distortion modifies the effective Hamiltonian, reroutes mediated connectivity, and influences control-pulse response. Across all tested layouts, EPAR's structural scores show 100% agreement with two-qubit error trends yet reveal over 10X robustness differences among edges with identical calibrated error rates, going beyond conventional metrics to provide improved and actionable compiler guidance.