ITITMay 20

Reed-Muller Codes for Joint Random and Stuck-At Error Correction

arXiv:2605.2172710.4
Predicted impact top 38% in IT · last 90 daysOriginality Incremental advance
AI Analysis

This work addresses the problem of reliable memory storage with both stuck-at defects and random errors, offering a low-complexity encoding/decoding scheme for hardware designers.

The paper introduces a recursive construction of masks for correcting stuck-at defects and random errors in memory, proving the masks are codewords in a Reed-Muller code. The method requires no mask search and adds minimal decoding complexity.

Block codes are considered for improving the reliability of messages stored in a computer memory with both stuck-at defects and random errors. It is assumed that the side information about the state of the defects is available to the encoder, but not to the decoder. A novel recursive construction of a set of masks is developed such that it can satisfy any $s$ stuck-at errors in a $2^m$ binary sequence, when $s \leq m$. We prove that the masks generated in this way are codewords in a Reed-Muller $RM(s-1, m)$ code. The constructed set contains no more than $2^s m^{s-1}$ masks. We provide the lower and the upper bound on the size of the stuck-at redundancy, a fixed subset of mask bits that uniquely represents each mask in the set. The stuck-at code constructed in this way is a non-linear code. It is also a subcode of an $RM(r,m)$ code, with $ r \geq s-1$, that can be used for additional random error correction. The encoding requires no mask search and is straightforward based on the description of the recursive construction. The decoding is done in a single attempt and requires almost no additional complexity or latency.

Foundations

The foundational work for this paper's niche, ranked by how specifically the neighbourhood builds on it — not by global fame.

Your Notes