Direct Time-of-Flight Measurement Accuracy Improvement With Perimeter-Gated SPADs
For developers of SPAD-based dToF systems, this provides a method to reduce device-level detection inaccuracy, though the improvement is incremental.
This work addresses measurement errors in direct time-of-flight (dToF) systems caused by timing jitters and SPAD dark noise. Using perimeter-gated SPADs (pg-SPADs) fabricated in 0.35 μm CMOS, they demonstrate improved accuracy in both free-running and time-gated operations.
Direct time of flight (dToF) measurements are susceptible to errors because of system-level and circuit-level timing jitters. In addition, device-level uncertainty stemming from the dark noise of single-photon avalanche diode (SPAD) contributes to the aggregated error. We demonstrate that perimeter gating can help reduce the device-level detection inaccuracy for SPAD devices by reducing the dark noise probability. Specifically, in this work, we developed a general framework to accurately estimate the dToF jitters stemming from different source levels and analyzed a counter-based time to digital converter (TDC) circuit that are commonly used in such systems. We have also measured dToFs using a perimeter-gated SPAD (pg-SPAD) detector fabricated in a 0.35 $μ$m standard CMOS process. Experimental results show that pg-SPADs can improve measurement accuracy in both free-running and time-gated operations.