靖之 小野

Bin Sun, Jingyi Zhou, Jianan Mu et al.

In traditional EDA flows, layout-level performance metrics are only obtainable after placement and routing, hindering global optimization at earlier stages. Although some neural-network-based solutions predict layout-level performance directly from netlists, they often face generalization challenges due to the black-box heuristics of commercial placement-and-routing tools, which create disparate data across designs. To this end, we propose ParaGate, a three-step cross-stage prediction framework that infers layout-level timing and power from netlists. First, we propose a two-phase transfer-learning approach to predict parasitic parameters, pre-training on mid-scale circuits and fine-tuning on larger ones to capture extreme conditions. Next, we rely on EDA tools for timing analysis, offloading the long-path numerical reasoning. Finally, ParaGate performs global calibration using subgraph features. Experiments show that ParaGate achieves strong generalization with minimal fine-tuning data: on openE906, its arrival-time R2 from 0.119 to 0.897. These results demonstrate that ParaGate could provide guidance for global optimization in the synthesis and placement stages.

Bin Sun, Rengang Zhang, Zhiteng Chao et al.

Automatic test pattern generation (ATPG) is a crucial process in integrated circuit (IC) design and testing, responsible for efficiently generating test patterns. As semiconductor technology progresses, traditional ATPG struggles with long execution times to achieve the expected fault coverage, which impacts the time-to-market of chips. Recent machine learning techniques, like reinforcement learning (RL) and graph neural networks (GNNs), show promise but face issues such as reward delay in RL models and inadequate circuit representation in GNN-based methods. In this paper, we propose InF-ATPG, an intelligent FFR-driven ATPG framework that overcomes these challenges by using advanced circuit representation to guide RL. By partitioning circuits into fanout-free regions (FFRs) and incorporating ATPG-specific features into a novel QGNN architecture, InF-ATPG enhances test pattern generation efficiency. Experimental results show InF-ATPG reduces backtracks by 55.06\% on average compared to traditional methods and 38.31\% compared to the machine learning approach, while also improving fault coverage.