3.9CVJun 30
Wavelet-Optimized Pseudo-3D Accelerated Diffusion Model for Truncated Computed LaminographyGenyuan Zhang, Junyao Wang, Chuandong Tan et al.
Computed Laminography (CL) is a key technology for the nondestructive testing of large plate-shaped objects. However, field-of-view (FOV) limitations inevitably lead to truncation of projected data, an ill-posed inverse problem that causes severe reconstruction artifacts. Existing deep learning methods typically rely on 2D architectures that lack rigorous data consistency constraints. Furthermore, they conventionally confine artifact removal strictly to the FOV, discarding potentially recoverable information outside it. To overcome these limitations, we first introduce a comprehensive CL FOV analysis, categorizing the space into data-complete, data-incomplete, and data-free regions. By extending our reconstruction target to encompass the data-incomplete region, we significantly expand the effective imaging range and enhance scanning efficiency. To achieve this, we propose a novel wavelet-optimized pseudo-3D accelerated diffusion model for CL truncation reconstruction (CL-DM). Our method utilizes a standard 2D diffusion model for slice aggregation, combined with a 3D model-based iterative reconstruction (MBIR) method to ensure strict data consistency. To mitigate inter-slice discontinuities, we introduce wavelet regularization along the z-direction, paired with a translation-invariant (TI) mechanism and a low-frequency preservation strategy. Finally, we introduce a 3D fast sampling architecture, significantly accelerating inference speed. Extensive simulations and real-world experiments demonstrate that CL-DM is superior in effectively eliminating truncation artifacts and restoring high-fidelity, continuous 3D structures.
6.5CVJun 30
RCL-Mamba: A Dual-domain State Space Model for Measurement-oriented Image Restoration in Rotational Sparse-View Scanning Computed LaminographyXuyang Duan, Genyuan Zhang, Zhenjiang Dong et al.
Rotational Scanning Computed Laminography (RCL) is widely utilized for the Non-Destructive Testing(NDT) of large planar components. However, to facilitate rapid inspection, continuous sparse-view scanning is often employed, where the angular integration effect during exposure induces rotational blur in the projection domain. Furthermore, the data incompleteness inherent in sparse sampling manifests as sparse artifacts in the reconstructed image domain. To address these cross-domain degradations, this paper proposes RCL-Mamba, a measurement-oriented dual-domain State Space Model (SSM)-based image restoration network. The framework adopts a cascaded joint processing strategy: it first corrects the rotational blur in the projection domain and subsequently suppresses the sparse artifacts in the image domain. Additionally, we design a Mamba-CNN dual-branch module to adaptively balance large-scale blur correction with local detail recovery. Evaluations on both simulated datasets and real-world Printed Circuit Board (PCB) scans demonstrate that RCL-Mamba outperforms existing baselines in blur removal, artifact suppression, and structural preservation. Line-profile-based structural measurement further verifies that the proposed method better preserves via/pad boundaries and slender trace profiles. Crucially, by reducing the required scanning views from 512 to 64, our method enhances inspection efficiency by approximately 8-fold without compromising reconstruction quality, offering a robust measurement-oriented restoration solution for high-throughput RCL inspection with improved structural measurement fidelity.