CVJun 30

RCL-Mamba: A Dual-domain State Space Model for Measurement-oriented Image Restoration in Rotational Sparse-View Scanning Computed Laminography

arXiv:2606.313536.5
Predicted impact top 63% in CV · last 90 daysOriginality Incremental advance
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For non-destructive testing of large planar components, this method enables high-throughput inspection with preserved structural measurement fidelity.

RCL-Mamba addresses cross-domain degradations (rotational blur in projection domain and sparse artifacts in image domain) in rotational sparse-view scanning computed laminography. It achieves 8-fold inspection efficiency improvement (512 to 64 views) without compromising reconstruction quality, outperforming baselines on simulated and real PCB scans.

Rotational Scanning Computed Laminography (RCL) is widely utilized for the Non-Destructive Testing(NDT) of large planar components. However, to facilitate rapid inspection, continuous sparse-view scanning is often employed, where the angular integration effect during exposure induces rotational blur in the projection domain. Furthermore, the data incompleteness inherent in sparse sampling manifests as sparse artifacts in the reconstructed image domain. To address these cross-domain degradations, this paper proposes RCL-Mamba, a measurement-oriented dual-domain State Space Model (SSM)-based image restoration network. The framework adopts a cascaded joint processing strategy: it first corrects the rotational blur in the projection domain and subsequently suppresses the sparse artifacts in the image domain. Additionally, we design a Mamba-CNN dual-branch module to adaptively balance large-scale blur correction with local detail recovery. Evaluations on both simulated datasets and real-world Printed Circuit Board (PCB) scans demonstrate that RCL-Mamba outperforms existing baselines in blur removal, artifact suppression, and structural preservation. Line-profile-based structural measurement further verifies that the proposed method better preserves via/pad boundaries and slender trace profiles. Crucially, by reducing the required scanning views from 512 to 64, our method enhances inspection efficiency by approximately 8-fold without compromising reconstruction quality, offering a robust measurement-oriented restoration solution for high-throughput RCL inspection with improved structural measurement fidelity.

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