Zhiyao Xie

Dimitrios Tsaras, Antoine Grosnit, Lei Chen et al.

Chip design relies heavily on generating Boolean circuits, such as AND-Inverter Graphs (AIGs), from functional descriptions like truth tables. This generation operation is a key process in logic synthesis, a primary chip design stage. While recent advances in deep learning have aimed to accelerate circuit design, these efforts have mostly focused on tasks other than synthesis, and traditional heuristic methods have plateaued. In this paper, we introduce ShortCircuit, a novel transformer-based architecture that leverages the structural properties of AIGs and performs efficient space exploration. Contrary to prior approaches attempting end-to-end generation of logic circuits using deep networks, ShortCircuit employs a two-phase process combining supervised with reinforcement learning to enhance generalization to unseen truth tables. We also propose an AlphaZero variant to handle the double exponentially large state space and the reward sparsity, enabling the discovery of near-optimal designs. To evaluate the generative performance of our model , we extract 500 truth tables from a set of 20 real-world circuits. ShortCircuit successfully generates AIGs for $98\%$ of the 8-input test truth tables, and outperforms the state-of-the-art logic synthesis tool, ABC, by $18.62\%$ in terms of circuits size.

Zhiyao Xie, Jingyu Pan, Chen-Chia Chang et al.

The growing IC complexity has led to a compelling need for design efficiency improvement through new electronic design automation (EDA) methodologies. In recent years, many unprecedented efficient EDA methods have been enabled by machine learning (ML) techniques. While ML demonstrates its great potential in circuit design, however, the dark side about security problems, is seldomly discussed. This paper gives a comprehensive and impartial summary of all security concerns we have observed in ML for EDA. Many of them are hidden or neglected by practitioners in this field. In this paper, we first provide our taxonomy to define four major types of security concerns, then we analyze different application scenarios and special properties in ML for EDA. After that, we present our detailed analysis of each security concern with experiments.

Zhiyao Xie

The stagnation of EDA technologies roots from insufficient knowledge reuse. In practice, very similar simulation or optimization results may need to be repeatedly constructed from scratch. This motivates my research on introducing more 'intelligence' to EDA with machine learning (ML), which explores complex correlations in design flows based on prior data. Besides design time, I also propose ML solutions to boost IC performance by assisting the circuit management at runtime. In this dissertation, I present multiple fast yet accurate ML models covering a wide range of chip design stages from the register-transfer level (RTL) to sign-off, solving primary chip-design problems about power, timing, interconnect, IR drop, routability, and design flow tuning. Targeting the RTL stage, I present APOLLO, a fully automated power modeling framework. It constructs an accurate per-cycle power model by extracting the most power-correlated signals. The model can be further implemented on chip for runtime power management with unprecedented low hardware costs. Targeting gate-level netlist, I present Net2 for early estimations on post-placement wirelength. It further enables more accurate timing analysis without actual physical design information. Targeting circuit layout, I present RouteNet for early routability prediction. As the first deep learning-based routability estimator, some feature-extraction and model-design principles proposed in it are widely adopted by later works. I also present PowerNet for fast IR drop estimation. It captures spatial and temporal information about power distribution with a customized CNN architecture. Last, besides targeting a single design step, I present FIST to efficiently tune design flow parameters during both logic synthesis and physical design.

Jingyu Pan, Chen-Chia Chang, Zhiyao Xie et al.

The application of Machine Learning (ML) in Electronic Design Automation (EDA) for Very Large-Scale Integration (VLSI) design has garnered significant research attention. Despite the requirement for extensive datasets to build effective ML models, most studies are limited to smaller, internally generated datasets due to the lack of comprehensive public resources. In response, we introduce EDALearn, the first holistic, open-source benchmark suite specifically for ML tasks in EDA. This benchmark suite presents an end-to-end flow from synthesis to physical implementation, enriching data collection across various stages. It fosters reproducibility and promotes research into ML transferability across different technology nodes. Accommodating a wide range of VLSI design instances and sizes, our benchmark aptly represents the complexity of contemporary VLSI designs. Additionally, we provide an in-depth data analysis, enabling users to fully comprehend the attributes and distribution of our data, which is essential for creating efficient ML models. Our contributions aim to encourage further advances in the ML-EDA domain.

Afzal Ahmad, Linfeng Du, Zhiyao Xie et al.

One of the primary challenges impeding the progress of Neural Architecture Search (NAS) is its extensive reliance on exorbitant computational resources. NAS benchmarks aim to simulate runs of NAS experiments at zero cost, remediating the need for extensive compute. However, existing NAS benchmarks use synthetic datasets and model proxies that make simplified assumptions about the characteristics of these datasets and models, leading to unrealistic evaluations. We present a technique that allows searching for training proxies that reduce the cost of benchmark construction by significant margins, making it possible to construct realistic NAS benchmarks for large-scale datasets. Using this technique, we construct an open-source bi-objective NAS benchmark for the ImageNet2012 dataset combined with the on-device performance of accelerators, including GPUs, TPUs, and FPGAs. Through extensive experimentation with various NAS optimizers and hardware platforms, we show that the benchmark is accurate and allows searching for state-of-the-art hardware-aware models at zero cost.

Wenji Fang, Jing Wang, Yao Lu et al.

Artificial intelligence (AI)-driven electronic design automation (EDA) techniques have been extensively explored for VLSI circuit design applications. Most recently, foundation AI models for circuits have emerged as a new technology trend. Unlike traditional task-specific AI solutions, these new AI models are developed through two stages: 1) self-supervised pre-training on a large amount of unlabeled data to learn intrinsic circuit properties; and 2) efficient fine-tuning for specific downstream applications, such as early-stage design quality evaluation, circuit-related context generation, and functional verification. This new paradigm brings many advantages: model generalization, less reliance on labeled circuit data, efficient adaptation to new tasks, and unprecedented generative capability. In this paper, we propose referring to AI models developed with this new paradigm as circuit foundation models (CFMs). This paper provides a comprehensive survey of the latest progress in circuit foundation models, unprecedentedly covering over 130 relevant works. Over 90% of our introduced works were published in or after 2022, indicating that this emerging research trend has attracted wide attention in a short period. In this survey, we propose to categorize all existing circuit foundation models into two primary types: 1) encoder-based methods performing general circuit representation learning for predictive tasks; and 2) decoder-based methods leveraging large language models (LLMs) for generative tasks. For our introduced works, we cover their input modalities, model architecture, pre-training strategies, domain adaptation techniques, and downstream design applications. In addition, this paper discussed the unique properties of circuits from the data perspective. These circuit properties have motivated many works in this domain and differentiated them from general AI techniques.

Qijun Zhang, Shiyu Li, Guanglei Zhou et al.

Power efficiency is a critical design objective in modern microprocessor design. To evaluate the impact of architectural-level design decisions, an accurate yet efficient architecture-level power model is desired. However, widely adopted data-independent analytical power models like McPAT and Wattch have been criticized for their unreliable accuracy. While some machine learning (ML) methods have been proposed for architecture-level power modeling, they rely on sufficient known designs for training and perform poorly when the number of available designs is limited, which is typically the case in realistic scenarios. In this work, we derive a general formulation that unifies existing architecture-level power models. Based on the formulation, we propose PANDA, an innovative architecture-level solution that combines the advantages of analytical and ML power models. It achieves unprecedented high accuracy on unknown new designs even when there are very limited designs for training, which is a common challenge in practice. Besides being an excellent power model, it can predict area, performance, and energy accurately. PANDA further supports power prediction for unknown new technology nodes. In our experiments, besides validating the superior performance and the wide range of functionalities of PANDA, we also propose an application scenario, where PANDA proves to identify high-performance design configurations given a power constraint.

Wenji Fang, Wenkai Li, Shang Liu et al.

Circuit representation learning has shown promise in advancing Electronic Design Automation (EDA) by capturing structural and functional circuit properties for various tasks. Existing pre-trained solutions rely on graph learning with complex functional supervision, such as truth table simulation. However, they only handle simple and-inverter graphs (AIGs), struggling to fully encode other complex gate functionalities. While large language models (LLMs) excel at functional understanding, they lack the structural awareness for flattened netlists. To advance netlist representation learning, we present NetTAG, a netlist foundation model that fuses gate semantics with graph structure, handling diverse gate types and supporting a variety of functional and physical tasks. Moving beyond existing graph-only methods, NetTAG formulates netlists as text-attributed graphs, with gates annotated by symbolic logic expressions and physical characteristics as text attributes. Its multimodal architecture combines an LLM-based text encoder for gate semantics and a graph transformer for global structure. Pre-trained with gate and graph self-supervised objectives and aligned with RTL and layout stages, NetTAG captures comprehensive circuit intrinsics. Experimental results show that NetTAG consistently outperforms each task-specific method on four largely different functional and physical tasks and surpasses state-of-the-art AIG encoders, demonstrating its versatility.

Jingyu Pan, Chen-Chia Chang, Zhiyao Xie et al.

Applying machine learning (ML) in design flow is a popular trend in EDA with various applications from design quality predictions to optimizations. Despite its promise, which has been demonstrated in both academic researches and industrial tools, its effectiveness largely hinges on the availability of a large amount of high-quality training data. In reality, EDA developers have very limited access to the latest design data, which is owned by design companies and mostly confidential. Although one can commission ML model training to a design company, the data of a single company might be still inadequate or biased, especially for small companies. Such data availability problem is becoming the limiting constraint on future growth of ML for chip design. In this work, we propose an Federated-Learning based approach for well-studied ML applications in EDA. Our approach allows an ML model to be collaboratively trained with data from multiple clients but without explicit access to the data for respecting their data privacy. To further strengthen the results, we co-design a customized ML model FLNet and its personalization under the decentralized training scenario. Experiments on a comprehensive dataset show that collaborative training improves accuracy by 11% compared with individual local models, and our customized model FLNet significantly outperforms the best of previous routability estimators in this collaborative training flow.

Chen-Chia Chang, Jingyu Pan, Tunhou Zhang et al.

The rise of machine learning technology inspires a boom of its applications in electronic design automation (EDA) and helps improve the degree of automation in chip designs. However, manually crafted machine learning models require extensive human expertise and tremendous engineering efforts. In this work, we leverage neural architecture search (NAS) to automate the development of high-quality neural architectures for routability prediction, which can help to guide cell placement toward routable solutions. Our search method supports various operations and highly flexible connections, leading to architectures significantly different from all previous human-crafted models. Experimental results on a large dataset demonstrate that our automatically generated neural architectures clearly outperform multiple representative manually crafted solutions. Compared to the best case of manually crafted models, NAS-generated models achieve 5.85% higher Kendall's $τ$ in predicting the number of nets with DRC violations and 2.12% better area under ROC curve (ROC-AUC) in DRC hotspot detection. Moreover, compared with human-crafted models, which easily take weeks to develop, our efficient NAS approach finishes the whole automatic search process with only 0.3 days.

Zhiyao Xie, Rongjian Liang, Xiaoqing Xu et al.

Net length is a key proxy metric for optimizing timing and power across various stages of a standard digital design flow. However, the bulk of net length information is not available until cell placement, and hence it is a significant challenge to explicitly consider net length optimization in design stages prior to placement, such as logic synthesis. This work addresses this challenge by proposing a graph attention network method with customization, called Net2, to estimate individual net length before cell placement. Its accuracy-oriented version Net2a achieves about 15% better accuracy than several previous works in identifying both long nets and long critical paths. Its fast version Net2f is more than 1000 times faster than placement while still outperforms previous works and other neural network techniques in terms of various accuracy metrics.

Zhiyao Xie, Guan-Qi Fang, Yu-Hung Huang et al.

Design flow parameters are of utmost importance to chip design quality and require a painfully long time to evaluate their effects. In reality, flow parameter tuning is usually performed manually based on designers' experience in an ad hoc manner. In this work, we introduce a machine learning-based automatic parameter tuning methodology that aims to find the best design quality with a limited number of trials. Instead of merely plugging in machine learning engines, we develop clustering and approximate sampling techniques for improving tuning efficiency. The feature extraction in this method can reuse knowledge from prior designs. Furthermore, we leverage a state-of-the-art XGBoost model and propose a novel dynamic tree technique to overcome overfitting. Experimental results on benchmark circuits show that our approach achieves 25% improvement in design quality or 37% reduction in sampling cost compared to random forest method, which is the kernel of a highly cited previous work. Our approach is further validated on two industrial designs. By sampling less than 0.02% of possible parameter sets, it reduces area by 1.83% and 1.43% compared to the best solutions hand-tuned by experienced designers.

Zhiyao Xie, Hai Li, Xiaoqing Xu et al.

IR drop constraint is a fundamental requirement enforced in almost all chip designs. However, its evaluation takes a long time, and mitigation techniques for fixing violations may require numerous iterations. As such, fast and accurate IR drop prediction becomes critical for reducing design turnaround time. Recently, machine learning (ML) techniques have been actively studied for fast IR drop estimation due to their promise and success in many fields. These studies target at various design stages with different emphasis, and accordingly, different ML algorithms are adopted and customized. This paper provides a review to the latest progress in ML-based IR drop estimation techniques. It also serves as a vehicle for discussing some general challenges faced by ML applications in electronics design automation (EDA), and demonstrating how to integrate ML models with conventional techniques for the better efficiency of EDA tools.