Duksan Ryu

Jeongwhan Choi, Duksan Ryu

With the rapid growth of cloud services driven by advancements in web service technology, selecting a high-quality service from a wide range of options has become a complex task. This study aims to address the challenges of data sparsity and the cold-start problem in web service recommendation using Quality of Service (QoS). We propose a novel approach called QoS-aware graph contrastive learning (QAGCL) for web service recommendation. Our model harnesses the power of graph contrastive learning to handle cold-start problems and improve recommendation accuracy effectively. By constructing contextually augmented graphs with geolocation information and randomness, our model provides diverse views. Through the use of graph convolutional networks and graph contrastive learning techniques, we learn user and service embeddings from these augmented graphs. The learned embeddings are then utilized to seamlessly integrate QoS considerations into the recommendation process. Experimental results demonstrate the superiority of our QAGCL model over several existing models, highlighting its effectiveness in addressing data sparsity and the cold-start problem in QoS-aware service recommendations. Our research contributes to the potential for more accurate recommendations in real-world scenarios, even with limited user-service interaction data.

Faisal Mohammad, Duksan Ryu

Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and recognition of the multiple overlapping defect types in wafer maps. To address these challenges, we propose ViT-Tiny, a lightweight Vision Transformer (ViT) framework optimized for wafer defect classification. Trained on the WM-38k dataset. ViT-Tiny outperforms its ViT-Base counterpart and state-of-the-art (SOTA) models, such as MSF-Trans and CNN-based architectures. Through extensive ablation studies, we determine that a patch size of 16 provides optimal performance. ViT-Tiny achieves an F1-score of 98.4%, surpassing MSF-Trans by 2.94% in four-defect classification, improving recall by 2.86% in two-defect classification, and increasing precision by 3.13% in three-defect classification. Additionally, it demonstrates enhanced robustness under limited labeled data conditions, making it a computationally efficient and reliable solution for real-world semiconductor defect detection.