3.6CVApr 3, 2025
Semiconductor Wafer Map Defect Classification with Tiny Vision TransformersFaisal Mohammad, Duksan Ryu
Semiconductor wafer defect classification is critical for ensuring high precision and yield in manufacturing. Traditional CNN-based models often struggle with class imbalances and recognition of the multiple overlapping defect types in wafer maps. To address these challenges, we propose ViT-Tiny, a lightweight Vision Transformer (ViT) framework optimized for wafer defect classification. Trained on the WM-38k dataset. ViT-Tiny outperforms its ViT-Base counterpart and state-of-the-art (SOTA) models, such as MSF-Trans and CNN-based architectures. Through extensive ablation studies, we determine that a patch size of 16 provides optimal performance. ViT-Tiny achieves an F1-score of 98.4%, surpassing MSF-Trans by 2.94% in four-defect classification, improving recall by 2.86% in two-defect classification, and increasing precision by 3.13% in three-defect classification. Additionally, it demonstrates enhanced robustness under limited labeled data conditions, making it a computationally efficient and reliable solution for real-world semiconductor defect detection.
1.8NENov 8, 2018
Short Term Load Forecasting Using Deep Neural NetworksFaisal Mohammad, Ki Boem Lee, Young-Chon Kim
Electricity load forecasting plays an important role in the energy planning such as generation and distribution. However, the nonlinearity and dynamic uncertainties in the smart grid environment are the main obstacles in forecasting accuracy. Deep Neural Network (DNN) is a set of intelligent computational algorithms that provide a comprehensive solution for modelling a complicated nonlinear relationship between the input and output through multiple hidden layers. In this paper, we propose DNN based electricity load forecasting system to manage the energy consumption in an efficient manner. We investigate the applicability of two deep neural network architectures Feed-forward Deep Neural Network (Deep-FNN) and Recurrent Deep Neural Network (Deep-RNN) to the New York Independent System Operator (NYISO) electricity load forecasting task. We test our algorithm with various activation functions such as Sigmoid, Hyperbolic Tangent (tanh) and Rectifier Linear Unit (ReLU). The performance measurement of two network architectures is compared in terms of Mean Absolute Percentage Error (MAPE) metric.