DSITLGAug 19, 2013

Optimal Algorithms for Testing Closeness of Discrete Distributions

arXiv:1308.3946v1244 citations
Originality Incremental advance
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This work provides optimal algorithms for distribution testing, a fundamental problem in statistics and machine learning, with incremental improvements over prior sub-linear time methods.

The paper tackled the problem of closeness testing for two discrete distributions by developing new testers for ℓ1 and ℓ2 distances, achieving sample complexity that is information-theoretically optimal to constant factors, with specific bounds such as Θ(max{n^{2/3}/ε^{4/3}, n^{1/2}/ε^2}) for ℓ1 testing.

We study the question of closeness testing for two discrete distributions. More precisely, given samples from two distributions $p$ and $q$ over an $n$-element set, we wish to distinguish whether $p=q$ versus $p$ is at least $\eps$-far from $q$, in either $\ell_1$ or $\ell_2$ distance. Batu et al. gave the first sub-linear time algorithms for these problems, which matched the lower bounds of Valiant up to a logarithmic factor in $n$, and a polynomial factor of $\eps.$ In this work, we present simple (and new) testers for both the $\ell_1$ and $\ell_2$ settings, with sample complexity that is information-theoretically optimal, to constant factors, both in the dependence on $n$, and the dependence on $\eps$; for the $\ell_1$ testing problem we establish that the sample complexity is $Θ(\max\{n^{2/3}/\eps^{4/3}, n^{1/2}/\eps^2 \}).$

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