Combinatorial Testing for Deep Learning Systems
This addresses the problem of ensuring robustness in safety-critical deep learning applications, though it is an incremental adaptation of existing testing methods.
The paper tackles the challenge of testing deep learning systems by adapting combinatorial testing (CT) to reduce the large state space, proposing coverage criteria and a test generation technique, and finds it a promising approach for evaluating robustness.
Deep learning (DL) has achieved remarkable progress over the past decade and been widely applied to many safety-critical applications. However, the robustness of DL systems recently receives great concerns, such as adversarial examples against computer vision systems, which could potentially result in severe consequences. Adopting testing techniques could help to evaluate the robustness of a DL system and therefore detect vulnerabilities at an early stage. The main challenge of testing such systems is that its runtime state space is too large: if we view each neuron as a runtime state for DL, then a DL system often contains massive states, rendering testing each state almost impossible. For traditional software, combinatorial testing (CT) is an effective testing technique to reduce the testing space while obtaining relatively high defect detection abilities. In this paper, we perform an exploratory study of CT on DL systems. We adapt the concept in CT and propose a set of coverage criteria for DL systems, as well as a CT coverage guided test generation technique. Our evaluation demonstrates that CT provides a promising avenue for testing DL systems. We further pose several open questions and interesting directions for combinatorial testing of DL systems.